Ellipsometric Studies of Polycrystalline Molybdenum Silicide Thin Films

Gespeichert in:

Autor*in:	Srinivas, G. [verfasserIn] Vankar, V.D.

Format:	Artikel

Erschienen:	1996

Umfang:	10

Übergeordnetes Werk:	Enthalten in: Materials research bulletin - Tarrytown, NY : Pergamon, 1966, 31(1996), 11, Seite 1331-1340
Übergeordnetes Werk:	volume:31 ; year:1996 ; number:11 ; pages:1331-1340 ; extent:10

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Ellipsometric Studies of Polycrystalline Molybdenum Silicide Thin Films

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