Wall angle measurement with a scanning probe microscope employing a one-dimensional force sensor

Gespeichert in:

Autor*in:	Griffith, J.E. [verfasserIn] Hopkins, L.C. Bryson, C.E. Berghaus, A. Snyder, E.J. Plombon, J.J. Vasilyev, L.A. Hecht, M. Bindell, J.B.

Format:	Artikel

Erschienen:	1997

Systematik:	UA 4922

Umfang:	4

Übergeordnetes Werk:	Enthalten in: Journal of vacuum science and technology / B - New York, NY : Inst., 1983, 15(1997), 6, Seite 2189-2192
Übergeordnetes Werk:	volume:15 ; year:1997 ; number:6 ; pages:2189-2192 ; extent:4

Katalog-ID:	OLC1528650247

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allfieldsSound	SW980121 (DE-627)OLC1528650247 (DE-599)GBVOLC1528650247 DE-627 ger DE-627 rakwb 530 UA 4922 AVZ rvk Griffith, J.E. verfasserin aut Wall angle measurement with a scanning probe microscope employing a one-dimensional force sensor 1997 4 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Hopkins, L.C. oth Bryson, C.E. oth Berghaus, A. oth Snyder, E.J. oth Plombon, J.J. oth Vasilyev, L.A. oth Hecht, M. oth Bindell, J.B. oth Enthalten in Journal of vacuum science and technology / B New York, NY : Inst., 1983 15(1997), 6, Seite 2189-2192 (DE-627)13062845X (DE-600)797726-8 (DE-576)016134419 2166-2746 nnns volume:15 year:1997 number:6 pages:2189-2192 extent:4 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_32 GBV_ILN_40 GBV_ILN_70 GBV_ILN_105 GBV_ILN_130 GBV_ILN_170 GBV_ILN_2002 GBV_ILN_2004 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2010 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_4027 GBV_ILN_4036 GBV_ILN_4046 GBV_ILN_4116 GBV_ILN_4126 GBV_ILN_4266 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4309 GBV_ILN_4313 GBV_ILN_4314 GBV_ILN_4315 GBV_ILN_4316 GBV_ILN_4317 GBV_ILN_4318 GBV_ILN_4319 GBV_ILN_4323 GBV_ILN_4700 UA 4922 AR 15 1997 6 2189-2192 4
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title	Wall angle measurement with a scanning probe microscope employing a one-dimensional force sensor
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title_full	Wall angle measurement with a scanning probe microscope employing a one-dimensional force sensor
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author-letter	Griffith, J.E.
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title_sort	wall angle measurement with a scanning probe microscope employing a one-dimensional force sensor
title_auth	Wall angle measurement with a scanning probe microscope employing a one-dimensional force sensor
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title_short	Wall angle measurement with a scanning probe microscope employing a one-dimensional force sensor
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author2	Hopkins, L.C. Bryson, C.E. Berghaus, A. Snyder, E.J. Plombon, J.J. Vasilyev, L.A. Hecht, M. Bindell, J.B.
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up_date	2024-07-03T19:23:48.850Z
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