Mapping of the magnetic leakage fields from nanoparticles by Fresnel projection microscopy

Gespeichert in:

Autor*in:	Binh, Vu Thien [verfasserIn] Purcell, S.T. Semet, V. Feschet, F.

Format:	Artikel

Erschienen:	1998

Umfang:	3

Übergeordnetes Werk:	Enthalten in: Applied physics letters - Melville, NY : AIP, 1962, 72(1998), 8, Seite 975-977
Übergeordnetes Werk:	volume:72 ; year:1998 ; number:8 ; pages:975-977 ; extent:3

Katalog-ID:	OLC1531058426

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Mapping of the magnetic leakage fields from nanoparticles by Fresnel projection microscopy

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