Improved steady-state photocarrier grating in nanocrystalline thin films after surface-roughness reduction by mechanical polishing

Gespeichert in:

Autor*in:	Brüggemann, R. [verfasserIn]

Format:	Artikel

Erschienen:	1998

Umfang:	3

Übergeordnetes Werk:	Enthalten in: Applied physics letters - Melville, NY : AIP, 1962, 73(1998), 4, Seite 499-501
Übergeordnetes Werk:	volume:73 ; year:1998 ; number:4 ; pages:499-501 ; extent:3

Katalog-ID:	OLC1538558122

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Improved steady-state photocarrier grating in nanocrystalline thin films after surface-roughness reduction by mechanical polishing

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