Transmission electron microscopy and x-ray structural investigation of La0.7Ca0.3MnO3 thin films

Gespeichert in:

Autor*in:	Li, Y.H. [verfasserIn] Thomas, K.A. Silva, P.S.I.P.N.de Cohen, L.F. Goyal, A. Rajeswari, M. Mathur, N.D. Blamire, M.G. Evetts, J.E. Venkatesan, T. MacManus-Driscoll, J.L.

Format:	Artikel

Erschienen:	1998

Systematik:	VA 5350

Umfang:	9

Übergeordnetes Werk:	Enthalten in: Journal of materials research - Warrendale, Pa. : Materials Research Society, 1986, 13(1998), 8, Seite 2161-2169
Übergeordnetes Werk:	volume:13 ; year:1998 ; number:8 ; pages:2161-2169 ; extent:9

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title_sort	transmission electron microscopy and x-ray structural investigation of la0.7ca0.3mno3 thin films
title_auth	Transmission electron microscopy and x-ray structural investigation of La0.7Ca0.3MnO3 thin films
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container_issue	8
title_short	Transmission electron microscopy and x-ray structural investigation of La0.7Ca0.3MnO3 thin films
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author2	Thomas, K.A. Silva, P.S.I.P.N.de Cohen, L.F. Goyal, A. Rajeswari, M. Mathur, N.D. Blamire, M.G. Evetts, J.E. Venkatesan, T. MacManus-Driscoll, J.L.
author2Str	Thomas, K.A. Silva, P.S.I.P.N.de Cohen, L.F. Goyal, A. Rajeswari, M. Mathur, N.D. Blamire, M.G. Evetts, J.E. Venkatesan, T. MacManus-Driscoll, J.L.
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up_date	2024-07-03T18:31:48.619Z
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