Two-step stress method for the dynamic testing of very thin (8 nm) SiO2 films
Autor*in: |
Rodriguez, R. [verfasserIn] |
---|
Format: |
Artikel |
---|
Erschienen: |
1998 |
---|
Umfang: |
6 |
---|
Übergeordnetes Werk: |
Enthalten in: Microelectronics reliability - Amsterdam [u.a.] : Elsevier, 1964, 38(1998), 6-8, Seite 1127-1132 |
---|---|
Übergeordnetes Werk: |
volume:38 ; year:1998 ; number:6-8 ; pages:1127-1132 ; extent:6 |
Katalog-ID: |
OLC1547332956 |
---|
LEADER | 01000caa a22002652 4500 | ||
---|---|---|---|
001 | OLC1547332956 | ||
003 | DE-627 | ||
005 | 20220221041221.0 | ||
007 | tu | ||
008 | 990207s1998 xx ||||| 00| ||und c | ||
028 | 5 | 2 | |a SW990109 |
035 | |a (DE-627)OLC1547332956 | ||
035 | |a (DE-599)GBVOLC1547332956 | ||
040 | |a DE-627 |b ger |c DE-627 |e rakwb | ||
082 | 0 | 4 | |a 620 |
084 | |a 53.55 |2 bkl | ||
084 | |a 53.52 |2 bkl | ||
084 | |a 50.16 |2 bkl | ||
100 | 1 | |a Rodriguez, R. |e verfasserin |4 aut | |
245 | 1 | 0 | |a Two-step stress method for the dynamic testing of very thin (8 nm) SiO2 films |
264 | 1 | |c 1998 | |
300 | |a 6 | ||
336 | |a Text |b txt |2 rdacontent | ||
337 | |a ohne Hilfsmittel zu benutzen |b n |2 rdamedia | ||
338 | |a Band |b nc |2 rdacarrier | ||
700 | 1 | |a Miranda, E. |4 oth | |
700 | 1 | |a Nafria, M. |4 oth | |
700 | 1 | |a Suñé, J. |4 oth | |
700 | 1 | |a Aymerich, X. |4 oth | |
773 | 0 | 8 | |i Enthalten in |t Microelectronics reliability |d Amsterdam [u.a.] : Elsevier, 1964 |g 38(1998), 6-8, Seite 1127-1132 |w (DE-627)129596949 |w (DE-600)240853-3 |w (DE-576)015090116 |x 0026-2714 |7 nnns |
773 | 1 | 8 | |g volume:38 |g year:1998 |g number:6-8 |g pages:1127-1132 |g extent:6 |
912 | |a GBV_USEFLAG_A | ||
912 | |a SYSFLAG_A | ||
912 | |a GBV_OLC | ||
912 | |a SSG-OLC-TEC | ||
912 | |a GBV_ILN_11 | ||
912 | |a GBV_ILN_21 | ||
912 | |a GBV_ILN_32 | ||
912 | |a GBV_ILN_40 | ||
912 | |a GBV_ILN_70 | ||
912 | |a GBV_ILN_136 | ||
912 | |a GBV_ILN_2006 | ||
912 | |a GBV_ILN_2021 | ||
912 | |a GBV_ILN_4046 | ||
912 | |a GBV_ILN_4307 | ||
912 | |a GBV_ILN_4309 | ||
912 | |a GBV_ILN_4700 | ||
936 | b | k | |a 53.55 |q AVZ |
936 | b | k | |a 53.52 |q AVZ |
936 | b | k | |a 50.16 |q AVZ |
951 | |a AR | ||
952 | |d 38 |j 1998 |e 6-8 |h 1127-1132 |g 6 |
author_variant |
r r rr |
---|---|
matchkey_str |
article:00262714:1998----::wsesrsmtofrhdnmcetnovr |
hierarchy_sort_str |
1998 |
bklnumber |
53.55 53.52 50.16 |
publishDate |
1998 |
allfields |
SW990109 (DE-627)OLC1547332956 (DE-599)GBVOLC1547332956 DE-627 ger DE-627 rakwb 620 53.55 bkl 53.52 bkl 50.16 bkl Rodriguez, R. verfasserin aut Two-step stress method for the dynamic testing of very thin (8 nm) SiO2 films 1998 6 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Miranda, E. oth Nafria, M. oth Suñé, J. oth Aymerich, X. oth Enthalten in Microelectronics reliability Amsterdam [u.a.] : Elsevier, 1964 38(1998), 6-8, Seite 1127-1132 (DE-627)129596949 (DE-600)240853-3 (DE-576)015090116 0026-2714 nnns volume:38 year:1998 number:6-8 pages:1127-1132 extent:6 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_11 GBV_ILN_21 GBV_ILN_32 GBV_ILN_40 GBV_ILN_70 GBV_ILN_136 GBV_ILN_2006 GBV_ILN_2021 GBV_ILN_4046 GBV_ILN_4307 GBV_ILN_4309 GBV_ILN_4700 53.55 AVZ 53.52 AVZ 50.16 AVZ AR 38 1998 6-8 1127-1132 6 |
spelling |
SW990109 (DE-627)OLC1547332956 (DE-599)GBVOLC1547332956 DE-627 ger DE-627 rakwb 620 53.55 bkl 53.52 bkl 50.16 bkl Rodriguez, R. verfasserin aut Two-step stress method for the dynamic testing of very thin (8 nm) SiO2 films 1998 6 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Miranda, E. oth Nafria, M. oth Suñé, J. oth Aymerich, X. oth Enthalten in Microelectronics reliability Amsterdam [u.a.] : Elsevier, 1964 38(1998), 6-8, Seite 1127-1132 (DE-627)129596949 (DE-600)240853-3 (DE-576)015090116 0026-2714 nnns volume:38 year:1998 number:6-8 pages:1127-1132 extent:6 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_11 GBV_ILN_21 GBV_ILN_32 GBV_ILN_40 GBV_ILN_70 GBV_ILN_136 GBV_ILN_2006 GBV_ILN_2021 GBV_ILN_4046 GBV_ILN_4307 GBV_ILN_4309 GBV_ILN_4700 53.55 AVZ 53.52 AVZ 50.16 AVZ AR 38 1998 6-8 1127-1132 6 |
allfields_unstemmed |
SW990109 (DE-627)OLC1547332956 (DE-599)GBVOLC1547332956 DE-627 ger DE-627 rakwb 620 53.55 bkl 53.52 bkl 50.16 bkl Rodriguez, R. verfasserin aut Two-step stress method for the dynamic testing of very thin (8 nm) SiO2 films 1998 6 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Miranda, E. oth Nafria, M. oth Suñé, J. oth Aymerich, X. oth Enthalten in Microelectronics reliability Amsterdam [u.a.] : Elsevier, 1964 38(1998), 6-8, Seite 1127-1132 (DE-627)129596949 (DE-600)240853-3 (DE-576)015090116 0026-2714 nnns volume:38 year:1998 number:6-8 pages:1127-1132 extent:6 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_11 GBV_ILN_21 GBV_ILN_32 GBV_ILN_40 GBV_ILN_70 GBV_ILN_136 GBV_ILN_2006 GBV_ILN_2021 GBV_ILN_4046 GBV_ILN_4307 GBV_ILN_4309 GBV_ILN_4700 53.55 AVZ 53.52 AVZ 50.16 AVZ AR 38 1998 6-8 1127-1132 6 |
allfieldsGer |
SW990109 (DE-627)OLC1547332956 (DE-599)GBVOLC1547332956 DE-627 ger DE-627 rakwb 620 53.55 bkl 53.52 bkl 50.16 bkl Rodriguez, R. verfasserin aut Two-step stress method for the dynamic testing of very thin (8 nm) SiO2 films 1998 6 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Miranda, E. oth Nafria, M. oth Suñé, J. oth Aymerich, X. oth Enthalten in Microelectronics reliability Amsterdam [u.a.] : Elsevier, 1964 38(1998), 6-8, Seite 1127-1132 (DE-627)129596949 (DE-600)240853-3 (DE-576)015090116 0026-2714 nnns volume:38 year:1998 number:6-8 pages:1127-1132 extent:6 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_11 GBV_ILN_21 GBV_ILN_32 GBV_ILN_40 GBV_ILN_70 GBV_ILN_136 GBV_ILN_2006 GBV_ILN_2021 GBV_ILN_4046 GBV_ILN_4307 GBV_ILN_4309 GBV_ILN_4700 53.55 AVZ 53.52 AVZ 50.16 AVZ AR 38 1998 6-8 1127-1132 6 |
allfieldsSound |
SW990109 (DE-627)OLC1547332956 (DE-599)GBVOLC1547332956 DE-627 ger DE-627 rakwb 620 53.55 bkl 53.52 bkl 50.16 bkl Rodriguez, R. verfasserin aut Two-step stress method for the dynamic testing of very thin (8 nm) SiO2 films 1998 6 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Miranda, E. oth Nafria, M. oth Suñé, J. oth Aymerich, X. oth Enthalten in Microelectronics reliability Amsterdam [u.a.] : Elsevier, 1964 38(1998), 6-8, Seite 1127-1132 (DE-627)129596949 (DE-600)240853-3 (DE-576)015090116 0026-2714 nnns volume:38 year:1998 number:6-8 pages:1127-1132 extent:6 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_11 GBV_ILN_21 GBV_ILN_32 GBV_ILN_40 GBV_ILN_70 GBV_ILN_136 GBV_ILN_2006 GBV_ILN_2021 GBV_ILN_4046 GBV_ILN_4307 GBV_ILN_4309 GBV_ILN_4700 53.55 AVZ 53.52 AVZ 50.16 AVZ AR 38 1998 6-8 1127-1132 6 |
source |
Enthalten in Microelectronics reliability 38(1998), 6-8, Seite 1127-1132 volume:38 year:1998 number:6-8 pages:1127-1132 extent:6 |
sourceStr |
Enthalten in Microelectronics reliability 38(1998), 6-8, Seite 1127-1132 volume:38 year:1998 number:6-8 pages:1127-1132 extent:6 |
format_phy_str_mv |
Article |
institution |
findex.gbv.de |
dewey-raw |
620 |
isfreeaccess_bool |
false |
container_title |
Microelectronics reliability |
authorswithroles_txt_mv |
Rodriguez, R. @@aut@@ Miranda, E. @@oth@@ Nafria, M. @@oth@@ Suñé, J. @@oth@@ Aymerich, X. @@oth@@ |
publishDateDaySort_date |
1998-01-01T00:00:00Z |
hierarchy_top_id |
129596949 |
dewey-sort |
3620 |
id |
OLC1547332956 |
fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC1547332956</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20220221041221.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">990207s1998 xx ||||| 00| ||und c</controlfield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">SW990109</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC1547332956</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVOLC1547332956</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">620</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">53.55</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">53.52</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">50.16</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Rodriguez, R.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Two-step stress method for the dynamic testing of very thin (8 nm) SiO2 films</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">1998</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">6</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Miranda, E.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Nafria, M.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Suñé, J.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Aymerich, X.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Microelectronics reliability</subfield><subfield code="d">Amsterdam [u.a.] : Elsevier, 1964</subfield><subfield code="g">38(1998), 6-8, Seite 1127-1132</subfield><subfield code="w">(DE-627)129596949</subfield><subfield code="w">(DE-600)240853-3</subfield><subfield code="w">(DE-576)015090116</subfield><subfield code="x">0026-2714</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:38</subfield><subfield code="g">year:1998</subfield><subfield code="g">number:6-8</subfield><subfield code="g">pages:1127-1132</subfield><subfield code="g">extent:6</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-TEC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_11</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_21</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_32</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_40</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_136</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2006</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2021</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4046</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4307</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4309</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4700</subfield></datafield><datafield tag="936" ind1="b" ind2="k"><subfield code="a">53.55</subfield><subfield code="q">AVZ</subfield></datafield><datafield tag="936" ind1="b" ind2="k"><subfield code="a">53.52</subfield><subfield code="q">AVZ</subfield></datafield><datafield tag="936" ind1="b" ind2="k"><subfield code="a">50.16</subfield><subfield code="q">AVZ</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">38</subfield><subfield code="j">1998</subfield><subfield code="e">6-8</subfield><subfield code="h">1127-1132</subfield><subfield code="g">6</subfield></datafield></record></collection>
|
author |
Rodriguez, R. |
spellingShingle |
Rodriguez, R. ddc 620 bkl 53.55 bkl 53.52 bkl 50.16 Two-step stress method for the dynamic testing of very thin (8 nm) SiO2 films |
authorStr |
Rodriguez, R. |
ppnlink_with_tag_str_mv |
@@773@@(DE-627)129596949 |
format |
Article |
dewey-ones |
620 - Engineering & allied operations |
delete_txt_mv |
keep |
author_role |
aut |
collection |
OLC |
remote_str |
false |
illustrated |
Not Illustrated |
issn |
0026-2714 |
topic_title |
620 53.55 bkl 53.52 bkl 50.16 bkl Two-step stress method for the dynamic testing of very thin (8 nm) SiO2 films |
topic |
ddc 620 bkl 53.55 bkl 53.52 bkl 50.16 |
topic_unstemmed |
ddc 620 bkl 53.55 bkl 53.52 bkl 50.16 |
topic_browse |
ddc 620 bkl 53.55 bkl 53.52 bkl 50.16 |
format_facet |
Aufsätze Gedruckte Aufsätze |
format_main_str_mv |
Text Zeitschrift/Artikel |
carriertype_str_mv |
nc |
author2_variant |
e m em m n mn j s js x a xa |
hierarchy_parent_title |
Microelectronics reliability |
hierarchy_parent_id |
129596949 |
dewey-tens |
620 - Engineering |
hierarchy_top_title |
Microelectronics reliability |
isfreeaccess_txt |
false |
familylinks_str_mv |
(DE-627)129596949 (DE-600)240853-3 (DE-576)015090116 |
title |
Two-step stress method for the dynamic testing of very thin (8 nm) SiO2 films |
ctrlnum |
(DE-627)OLC1547332956 (DE-599)GBVOLC1547332956 |
title_full |
Two-step stress method for the dynamic testing of very thin (8 nm) SiO2 films |
author_sort |
Rodriguez, R. |
journal |
Microelectronics reliability |
journalStr |
Microelectronics reliability |
isOA_bool |
false |
dewey-hundreds |
600 - Technology |
recordtype |
marc |
publishDateSort |
1998 |
contenttype_str_mv |
txt |
container_start_page |
1127 |
author_browse |
Rodriguez, R. |
container_volume |
38 |
physical |
6 |
class |
620 53.55 bkl 53.52 bkl 50.16 bkl |
format_se |
Aufsätze |
author-letter |
Rodriguez, R. |
dewey-full |
620 |
title_sort |
two-step stress method for the dynamic testing of very thin (8 nm) sio2 films |
title_auth |
Two-step stress method for the dynamic testing of very thin (8 nm) SiO2 films |
collection_details |
GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_11 GBV_ILN_21 GBV_ILN_32 GBV_ILN_40 GBV_ILN_70 GBV_ILN_136 GBV_ILN_2006 GBV_ILN_2021 GBV_ILN_4046 GBV_ILN_4307 GBV_ILN_4309 GBV_ILN_4700 |
container_issue |
6-8 |
title_short |
Two-step stress method for the dynamic testing of very thin (8 nm) SiO2 films |
remote_bool |
false |
author2 |
Miranda, E. Nafria, M. Suñé, J. Aymerich, X. |
author2Str |
Miranda, E. Nafria, M. Suñé, J. Aymerich, X. |
ppnlink |
129596949 |
mediatype_str_mv |
n |
isOA_txt |
false |
hochschulschrift_bool |
false |
author2_role |
oth oth oth oth |
up_date |
2024-07-03T13:52:29.509Z |
_version_ |
1803566185982197760 |
fullrecord_marcxml |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC1547332956</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20220221041221.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">990207s1998 xx ||||| 00| ||und c</controlfield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">SW990109</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC1547332956</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVOLC1547332956</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">620</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">53.55</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">53.52</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">50.16</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Rodriguez, R.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Two-step stress method for the dynamic testing of very thin (8 nm) SiO2 films</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">1998</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">6</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Miranda, E.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Nafria, M.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Suñé, J.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Aymerich, X.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Microelectronics reliability</subfield><subfield code="d">Amsterdam [u.a.] : Elsevier, 1964</subfield><subfield code="g">38(1998), 6-8, Seite 1127-1132</subfield><subfield code="w">(DE-627)129596949</subfield><subfield code="w">(DE-600)240853-3</subfield><subfield code="w">(DE-576)015090116</subfield><subfield code="x">0026-2714</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:38</subfield><subfield code="g">year:1998</subfield><subfield code="g">number:6-8</subfield><subfield code="g">pages:1127-1132</subfield><subfield code="g">extent:6</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-TEC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_11</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_21</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_32</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_40</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_136</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2006</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2021</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4046</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4307</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4309</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4700</subfield></datafield><datafield tag="936" ind1="b" ind2="k"><subfield code="a">53.55</subfield><subfield code="q">AVZ</subfield></datafield><datafield tag="936" ind1="b" ind2="k"><subfield code="a">53.52</subfield><subfield code="q">AVZ</subfield></datafield><datafield tag="936" ind1="b" ind2="k"><subfield code="a">50.16</subfield><subfield code="q">AVZ</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">38</subfield><subfield code="j">1998</subfield><subfield code="e">6-8</subfield><subfield code="h">1127-1132</subfield><subfield code="g">6</subfield></datafield></record></collection>
|
score |
7.4003325 |