Method for increasing sensitivity of shear-force distance control for scanning near-field microscopy

Gespeichert in:

Autor*in:	Kantor, R. [verfasserIn] Lesnak, M. Berdunov, N. Shvets, I.V.

Format:	Artikel

Erschienen:	1999

Umfang:	4

Übergeordnetes Werk:	Enthalten in: Applied surface science - Amsterdam [u.a.] : Elsevier, 1985, 144(1999), Seite 510-513
Übergeordnetes Werk:	volume:144 ; year:1999 ; pages:510-513 ; extent:4

Katalog-ID:	OLC1555777333

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Method for increasing sensitivity of shear-force distance control for scanning near-field microscopy

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