ELECTRONIC STRUCTURE AND TRANSPORT (PACS 71-73) - Excess silicon at the silicon nitride-thermal oxide interface in oxide-nitride-oxide structures

Gespeichert in:

Autor*in:	Gritsenko, V.A. [verfasserIn] Wong, Hei Xu, J.B. Kwok, R.M. Petrenko, I.P. Zaitsev, B.A. Morokov, Yu N. Novikov, Yu N.

Format:	Artikel

Erschienen:	1999

Umfang:	7

Übergeordnetes Werk:	Enthalten in: Journal of applied physics - Melville, NY : AIP, 1937, 86(1999), 6, Seite 3234-3240
Übergeordnetes Werk:	volume:86 ; year:1999 ; number:6 ; pages:3234-3240 ; extent:7

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allfields	SW990921 (DE-627)OLC1559868066 (DE-599)GBVOLC1559868066 DE-627 ger DE-627 rakwb 530 Gritsenko, V.A. verfasserin aut ELECTRONIC STRUCTURE AND TRANSPORT (PACS 71-73) - Excess silicon at the silicon nitride-thermal oxide interface in oxide-nitride-oxide structures 1999 7 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Wong, Hei oth Xu, J.B. oth Kwok, R.M. oth Petrenko, I.P. oth Zaitsev, B.A. oth Morokov, Yu N. oth Novikov, Yu N. oth Enthalten in Journal of applied physics Melville, NY : AIP, 1937 86(1999), 6, Seite 3234-3240 (DE-627)129079030 (DE-600)3112-4 (DE-576)014411652 0021-8979 nnns volume:86 year:1999 number:6 pages:3234-3240 extent:7 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_30 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_59 GBV_ILN_62 GBV_ILN_70 GBV_ILN_130 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2006 GBV_ILN_2010 GBV_ILN_2014 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2027 GBV_ILN_2185 GBV_ILN_2279 GBV_ILN_2409 GBV_ILN_4082 GBV_ILN_4126 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4310 GBV_ILN_4313 GBV_ILN_4318 GBV_ILN_4319 GBV_ILN_4323 GBV_ILN_4700 AR 86 1999 6 3234-3240 7
spelling	SW990921 (DE-627)OLC1559868066 (DE-599)GBVOLC1559868066 DE-627 ger DE-627 rakwb 530 Gritsenko, V.A. verfasserin aut ELECTRONIC STRUCTURE AND TRANSPORT (PACS 71-73) - Excess silicon at the silicon nitride-thermal oxide interface in oxide-nitride-oxide structures 1999 7 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Wong, Hei oth Xu, J.B. oth Kwok, R.M. oth Petrenko, I.P. oth Zaitsev, B.A. oth Morokov, Yu N. oth Novikov, Yu N. oth Enthalten in Journal of applied physics Melville, NY : AIP, 1937 86(1999), 6, Seite 3234-3240 (DE-627)129079030 (DE-600)3112-4 (DE-576)014411652 0021-8979 nnns volume:86 year:1999 number:6 pages:3234-3240 extent:7 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_30 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_59 GBV_ILN_62 GBV_ILN_70 GBV_ILN_130 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2006 GBV_ILN_2010 GBV_ILN_2014 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2027 GBV_ILN_2185 GBV_ILN_2279 GBV_ILN_2409 GBV_ILN_4082 GBV_ILN_4126 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4310 GBV_ILN_4313 GBV_ILN_4318 GBV_ILN_4319 GBV_ILN_4323 GBV_ILN_4700 AR 86 1999 6 3234-3240 7
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title_sort	electronic structure and transport (pacs 71-73) - excess silicon at the silicon nitride-thermal oxide interface in oxide-nitride-oxide structures
title_auth	ELECTRONIC STRUCTURE AND TRANSPORT (PACS 71-73) - Excess silicon at the silicon nitride-thermal oxide interface in oxide-nitride-oxide structures
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title_short	ELECTRONIC STRUCTURE AND TRANSPORT (PACS 71-73) - Excess silicon at the silicon nitride-thermal oxide interface in oxide-nitride-oxide structures
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author2	Wong, Hei Xu, J.B. Kwok, R.M. Petrenko, I.P. Zaitsev, B.A. Morokov, Yu N. Novikov, Yu N.
author2Str	Wong, Hei Xu, J.B. Kwok, R.M. Petrenko, I.P. Zaitsev, B.A. Morokov, Yu N. Novikov, Yu N.
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up_date	2024-07-03T18:28:27.622Z
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