Short communications - The Huber G670 imaging-plate Guinier camera tested on beamline 1711 at the MAX II synchrotron - The Huber G670 Guinier powder diffractometer provided high-quality Rietveld-refinable data in a matter of seconds using a synchrotron source

Gespeichert in:

Autor*in:	Ståhl, K. [verfasserIn]

Format:	Artikel

Erschienen:	2000

Umfang:	3

Übergeordnetes Werk:	Enthalten in: Journal of applied crystallography - Oxford : Blackwell, 1968, 33(2000), 2, Seite 394-396
Übergeordnetes Werk:	volume:33 ; year:2000 ; number:2 ; pages:394-396 ; extent:3

Katalog-ID:	OLC1571952470

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title_auth	Short communications - The Huber G670 imaging-plate Guinier camera tested on beamline 1711 at the MAX II synchrotron - The Huber G670 Guinier powder diffractometer provided high-quality Rietveld-refinable data in a matter of seconds using a synchrotron source
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title_short	Short communications - The Huber G670 imaging-plate Guinier camera tested on beamline 1711 at the MAX II synchrotron - The Huber G670 Guinier powder diffractometer provided high-quality Rietveld-refinable data in a matter of seconds using a synchrotron source
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Short communications - The Huber G670 imaging-plate Guinier camera tested on beamline 1711 at the MAX II synchrotron - The Huber G670 Guinier powder diffractometer provided high-quality Rietveld-refinable data in a matter of seconds using a synchrotron source

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