APPLICATION OF POSITRON BEAMS - Effect of radiation damage on luminescence of erbium-implanted SiO2-Si studied by slow positron beam

Gespeichert in:

Autor*in:	Kawasuso, A. [verfasserIn] Arai, H. Hirata, K. Sekiguchi, T. Kobayashi, Y. Okada, S.

Format:	Artikel

Erschienen:	2000

Umfang:	6

Übergeordnetes Werk:	Enthalten in: Radiation physics and chemistry - Amsterdam : Elsevier, 1977, 58(2000), 5-6, Seite 615-620
Übergeordnetes Werk:	volume:58 ; year:2000 ; number:5-6 ; pages:615-620 ; extent:6

Katalog-ID:	OLC157532220X

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