SPECIAL SECTION: SURFACE CHARACTERIZATION - Investigations of semiconductor surfaces and interfaces by X-ray grazing incidence diffraction

Gespeichert in:

Autor*in:	Pietsch, Ullrich [verfasserIn]

Format:	Artikel

Erschienen:	2000

Umfang:	12

Übergeordnetes Werk:	Enthalten in: Current science - Bangalore : Assoc., 1932, 78(2000), 12, Seite 1484-1495
Übergeordnetes Werk:	volume:78 ; year:2000 ; number:12 ; pages:1484-1495 ; extent:12

Katalog-ID:	OLC1576719464

Internformat


LEADER	01000caa a22002652 4500
001	OLC1576719464
003	DE-627
005	20230513031044.0
007	tu
008	000821s2000 xx \|\|\|\|\| 00\| \|\|und c
028	5	2	\|a SW000821
035			\|a (DE-627)OLC1576719464
035			\|a (DE-599)GBVOLC1576719464
040			\|a DE-627 \|b ger \|c DE-627 \|e rakwb
082	0	4	\|a 500
084			\|a 30.00 \|2 bkl
100	1		\|a Pietsch, Ullrich \|e verfasserin \|4 aut
245	1	0	\|a SPECIAL SECTION: SURFACE CHARACTERIZATION - Investigations of semiconductor surfaces and interfaces by X-ray grazing incidence diffraction
264		1	\|c 2000
300			\|a 12
336			\|a Text \|b txt \|2 rdacontent
337			\|a ohne Hilfsmittel zu benutzen \|b n \|2 rdamedia
338			\|a Band \|b nc \|2 rdacarrier
773	0	8	\|i Enthalten in \|t Current science \|d Bangalore : Assoc., 1932 \|g 78(2000), 12, Seite 1484-1495 \|w (DE-627)129493775 \|w (DE-600)206836-9 \|w (DE-576)014890526 \|x 0011-3891 \|7 nnns
773	1	8	\|g volume:78 \|g year:2000 \|g number:12 \|g pages:1484-1495 \|g extent:12
912			\|a GBV_USEFLAG_A
912			\|a SYSFLAG_A
912			\|a GBV_OLC
912			\|a SSG-OLC-PHY
912			\|a SSG-OLC-CHE
912			\|a SSG-OLC-FOR
912			\|a SSG-OLC-PHA
912			\|a SSG-OLC-DE-84
912			\|a GBV_ILN_11
912			\|a GBV_ILN_40
912			\|a GBV_ILN_70
912			\|a GBV_ILN_171
912			\|a GBV_ILN_2007
912			\|a GBV_ILN_4155
912			\|a GBV_ILN_4219
936	b	k	\|a 30.00 \|q AVZ
951			\|a AR
952			\|d 78 \|j 2000 \|e 12 \|h 1484-1495 \|g 12

Indexfelder

author_variant	u p up
matchkey_str	article:00113891:2000----::pcascinufccaatrztoivsiainosmcnutrufcsnitraebx
hierarchy_sort_str	2000
bklnumber	30.00
publishDate	2000
allfields	SW000821 (DE-627)OLC1576719464 (DE-599)GBVOLC1576719464 DE-627 ger DE-627 rakwb 500 30.00 bkl Pietsch, Ullrich verfasserin aut SPECIAL SECTION: SURFACE CHARACTERIZATION - Investigations of semiconductor surfaces and interfaces by X-ray grazing incidence diffraction 2000 12 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Enthalten in Current science Bangalore : Assoc., 1932 78(2000), 12, Seite 1484-1495 (DE-627)129493775 (DE-600)206836-9 (DE-576)014890526 0011-3891 nnns volume:78 year:2000 number:12 pages:1484-1495 extent:12 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY SSG-OLC-CHE SSG-OLC-FOR SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_11 GBV_ILN_40 GBV_ILN_70 GBV_ILN_171 GBV_ILN_2007 GBV_ILN_4155 GBV_ILN_4219 30.00 AVZ AR 78 2000 12 1484-1495 12
spelling	SW000821 (DE-627)OLC1576719464 (DE-599)GBVOLC1576719464 DE-627 ger DE-627 rakwb 500 30.00 bkl Pietsch, Ullrich verfasserin aut SPECIAL SECTION: SURFACE CHARACTERIZATION - Investigations of semiconductor surfaces and interfaces by X-ray grazing incidence diffraction 2000 12 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Enthalten in Current science Bangalore : Assoc., 1932 78(2000), 12, Seite 1484-1495 (DE-627)129493775 (DE-600)206836-9 (DE-576)014890526 0011-3891 nnns volume:78 year:2000 number:12 pages:1484-1495 extent:12 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY SSG-OLC-CHE SSG-OLC-FOR SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_11 GBV_ILN_40 GBV_ILN_70 GBV_ILN_171 GBV_ILN_2007 GBV_ILN_4155 GBV_ILN_4219 30.00 AVZ AR 78 2000 12 1484-1495 12
allfields_unstemmed	SW000821 (DE-627)OLC1576719464 (DE-599)GBVOLC1576719464 DE-627 ger DE-627 rakwb 500 30.00 bkl Pietsch, Ullrich verfasserin aut SPECIAL SECTION: SURFACE CHARACTERIZATION - Investigations of semiconductor surfaces and interfaces by X-ray grazing incidence diffraction 2000 12 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Enthalten in Current science Bangalore : Assoc., 1932 78(2000), 12, Seite 1484-1495 (DE-627)129493775 (DE-600)206836-9 (DE-576)014890526 0011-3891 nnns volume:78 year:2000 number:12 pages:1484-1495 extent:12 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY SSG-OLC-CHE SSG-OLC-FOR SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_11 GBV_ILN_40 GBV_ILN_70 GBV_ILN_171 GBV_ILN_2007 GBV_ILN_4155 GBV_ILN_4219 30.00 AVZ AR 78 2000 12 1484-1495 12
allfieldsGer	SW000821 (DE-627)OLC1576719464 (DE-599)GBVOLC1576719464 DE-627 ger DE-627 rakwb 500 30.00 bkl Pietsch, Ullrich verfasserin aut SPECIAL SECTION: SURFACE CHARACTERIZATION - Investigations of semiconductor surfaces and interfaces by X-ray grazing incidence diffraction 2000 12 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Enthalten in Current science Bangalore : Assoc., 1932 78(2000), 12, Seite 1484-1495 (DE-627)129493775 (DE-600)206836-9 (DE-576)014890526 0011-3891 nnns volume:78 year:2000 number:12 pages:1484-1495 extent:12 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY SSG-OLC-CHE SSG-OLC-FOR SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_11 GBV_ILN_40 GBV_ILN_70 GBV_ILN_171 GBV_ILN_2007 GBV_ILN_4155 GBV_ILN_4219 30.00 AVZ AR 78 2000 12 1484-1495 12
allfieldsSound	SW000821 (DE-627)OLC1576719464 (DE-599)GBVOLC1576719464 DE-627 ger DE-627 rakwb 500 30.00 bkl Pietsch, Ullrich verfasserin aut SPECIAL SECTION: SURFACE CHARACTERIZATION - Investigations of semiconductor surfaces and interfaces by X-ray grazing incidence diffraction 2000 12 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Enthalten in Current science Bangalore : Assoc., 1932 78(2000), 12, Seite 1484-1495 (DE-627)129493775 (DE-600)206836-9 (DE-576)014890526 0011-3891 nnns volume:78 year:2000 number:12 pages:1484-1495 extent:12 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY SSG-OLC-CHE SSG-OLC-FOR SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_11 GBV_ILN_40 GBV_ILN_70 GBV_ILN_171 GBV_ILN_2007 GBV_ILN_4155 GBV_ILN_4219 30.00 AVZ AR 78 2000 12 1484-1495 12
source	Enthalten in Current science 78(2000), 12, Seite 1484-1495 volume:78 year:2000 number:12 pages:1484-1495 extent:12
sourceStr	Enthalten in Current science 78(2000), 12, Seite 1484-1495 volume:78 year:2000 number:12 pages:1484-1495 extent:12
format_phy_str_mv	Article
institution	findex.gbv.de
dewey-raw	500
isfreeaccess_bool	false
container_title	Current science
authorswithroles_txt_mv	Pietsch, Ullrich @@aut@@
publishDateDaySort_date	2000-01-01T00:00:00Z
hierarchy_top_id	129493775
dewey-sort	3500
id	OLC1576719464
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC1576719464</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230513031044.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">000821s2000 xx \|\|\|\|\| 00\| \|\|und c</controlfield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">SW000821</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC1576719464</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVOLC1576719464</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">500</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">30.00</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Pietsch, Ullrich</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">SPECIAL SECTION: SURFACE CHARACTERIZATION - Investigations of semiconductor surfaces and interfaces by X-ray grazing incidence diffraction</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2000</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">12</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Current science</subfield><subfield code="d">Bangalore : Assoc., 1932</subfield><subfield code="g">78(2000), 12, Seite 1484-1495</subfield><subfield code="w">(DE-627)129493775</subfield><subfield code="w">(DE-600)206836-9</subfield><subfield code="w">(DE-576)014890526</subfield><subfield code="x">0011-3891</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:78</subfield><subfield code="g">year:2000</subfield><subfield code="g">number:12</subfield><subfield code="g">pages:1484-1495</subfield><subfield code="g">extent:12</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-CHE</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-FOR</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHA</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-DE-84</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_11</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_40</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_171</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2007</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4155</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4219</subfield></datafield><datafield tag="936" ind1="b" ind2="k"><subfield code="a">30.00</subfield><subfield code="q">AVZ</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">78</subfield><subfield code="j">2000</subfield><subfield code="e">12</subfield><subfield code="h">1484-1495</subfield><subfield code="g">12</subfield></datafield></record></collection>
author	Pietsch, Ullrich
spellingShingle	Pietsch, Ullrich ddc 500 bkl 30.00 SPECIAL SECTION: SURFACE CHARACTERIZATION - Investigations of semiconductor surfaces and interfaces by X-ray grazing incidence diffraction
authorStr	Pietsch, Ullrich
ppnlink_with_tag_str_mv	@@773@@(DE-627)129493775
format	Article
dewey-ones	500 - Natural sciences & mathematics
delete_txt_mv	keep
author_role	aut
collection	OLC
remote_str	false
illustrated	Not Illustrated
issn	0011-3891
topic_title	500 30.00 bkl SPECIAL SECTION: SURFACE CHARACTERIZATION - Investigations of semiconductor surfaces and interfaces by X-ray grazing incidence diffraction
topic	ddc 500 bkl 30.00
topic_unstemmed	ddc 500 bkl 30.00
topic_browse	ddc 500 bkl 30.00
format_facet	Aufsätze Gedruckte Aufsätze
format_main_str_mv	Text Zeitschrift/Artikel
carriertype_str_mv	nc
hierarchy_parent_title	Current science
hierarchy_parent_id	129493775
dewey-tens	500 - Science
hierarchy_top_title	Current science
isfreeaccess_txt	false
familylinks_str_mv	(DE-627)129493775 (DE-600)206836-9 (DE-576)014890526
title	SPECIAL SECTION: SURFACE CHARACTERIZATION - Investigations of semiconductor surfaces and interfaces by X-ray grazing incidence diffraction
ctrlnum	(DE-627)OLC1576719464 (DE-599)GBVOLC1576719464
title_full	SPECIAL SECTION: SURFACE CHARACTERIZATION - Investigations of semiconductor surfaces and interfaces by X-ray grazing incidence diffraction
author_sort	Pietsch, Ullrich
journal	Current science
journalStr	Current science
isOA_bool	false
dewey-hundreds	500 - Science
recordtype	marc
publishDateSort	2000
contenttype_str_mv	txt
container_start_page	1484
author_browse	Pietsch, Ullrich
container_volume	78
physical	12
class	500 30.00 bkl
format_se	Aufsätze
author-letter	Pietsch, Ullrich
dewey-full	500
title_sort	special section: surface characterization - investigations of semiconductor surfaces and interfaces by x-ray grazing incidence diffraction
title_auth	SPECIAL SECTION: SURFACE CHARACTERIZATION - Investigations of semiconductor surfaces and interfaces by X-ray grazing incidence diffraction
collection_details	GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY SSG-OLC-CHE SSG-OLC-FOR SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_11 GBV_ILN_40 GBV_ILN_70 GBV_ILN_171 GBV_ILN_2007 GBV_ILN_4155 GBV_ILN_4219
container_issue	12
title_short	SPECIAL SECTION: SURFACE CHARACTERIZATION - Investigations of semiconductor surfaces and interfaces by X-ray grazing incidence diffraction
remote_bool	false
ppnlink	129493775
mediatype_str_mv	n
isOA_txt	false
hochschulschrift_bool	false
up_date	2024-07-03T20:59:06.727Z
_version_	1803593026609610752
fullrecord_marcxml	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC1576719464</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230513031044.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">000821s2000 xx \|\|\|\|\| 00\| \|\|und c</controlfield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">SW000821</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC1576719464</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVOLC1576719464</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">500</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">30.00</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Pietsch, Ullrich</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">SPECIAL SECTION: SURFACE CHARACTERIZATION - Investigations of semiconductor surfaces and interfaces by X-ray grazing incidence diffraction</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2000</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">12</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Current science</subfield><subfield code="d">Bangalore : Assoc., 1932</subfield><subfield code="g">78(2000), 12, Seite 1484-1495</subfield><subfield code="w">(DE-627)129493775</subfield><subfield code="w">(DE-600)206836-9</subfield><subfield code="w">(DE-576)014890526</subfield><subfield code="x">0011-3891</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:78</subfield><subfield code="g">year:2000</subfield><subfield code="g">number:12</subfield><subfield code="g">pages:1484-1495</subfield><subfield code="g">extent:12</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-CHE</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-FOR</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHA</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-DE-84</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_11</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_40</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_171</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2007</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4155</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4219</subfield></datafield><datafield tag="936" ind1="b" ind2="k"><subfield code="a">30.00</subfield><subfield code="q">AVZ</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">78</subfield><subfield code="j">2000</subfield><subfield code="e">12</subfield><subfield code="h">1484-1495</subfield><subfield code="g">12</subfield></datafield></record></collection>
score	7.400467

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