SPECIAL ISSUE ON SYSTEM-LEVEL INTERCONNECT PREDICTION (SLIP) - REGULAR SECTION PAPERS - Intrinsic Leakage in Deep Submicron CMOS ICs -- Measurement-Based Test Solutions

Gespeichert in:

Autor*in:	Keshavarzi, A. [verfasserIn] Roy, K. Hawkins, C.F.

Format:	Artikel

Erschienen:	2000

Umfang:	7

Übergeordnetes Werk:	Enthalten in: IEEE transactions on very large scale integration (VLSI) systems - New York, NY : Institute of Electrical and Electronics Engineers, 1993, 8(2000), 6, Seite 717-723
Übergeordnetes Werk:	volume:8 ; year:2000 ; number:6 ; pages:717-723 ; extent:7

Katalog-ID:	OLC1599924749

Internformat


LEADER	01000caa a22002652 4500
001	OLC1599924749
003	DE-627
005	20230706052911.0
007	tu
008	010307s2000 xx \|\|\|\|\| 00\| \|\|und c
028	5	2	\|a SW010305
035			\|a (DE-627)OLC1599924749
035			\|a (DE-599)GBVOLC1599924749
040			\|a DE-627 \|b ger \|c DE-627 \|e rakwb
082	0	4	\|a 004 \|a 620
100	1		\|a Keshavarzi, A. \|e verfasserin \|4 aut
245	1	0	\|a SPECIAL ISSUE ON SYSTEM-LEVEL INTERCONNECT PREDICTION (SLIP) - REGULAR SECTION PAPERS - Intrinsic Leakage in Deep Submicron CMOS ICs -- Measurement-Based Test Solutions
264		1	\|c 2000
300			\|a 7
336			\|a Text \|b txt \|2 rdacontent
337			\|a ohne Hilfsmittel zu benutzen \|b n \|2 rdamedia
338			\|a Band \|b nc \|2 rdacarrier
700	1		\|a Roy, K. \|4 oth
700	1		\|a Hawkins, C.F. \|4 oth
773	0	8	\|i Enthalten in \|t IEEE transactions on very large scale integration (VLSI) systems \|d New York, NY : Institute of Electrical and Electronics Engineers, 1993 \|g 8(2000), 6, Seite 717-723 \|w (DE-627)165670282 \|w (DE-600)1151835-2 \|w (DE-576)034204024 \|x 1063-8210 \|7 nnns
773	1	8	\|g volume:8 \|g year:2000 \|g number:6 \|g pages:717-723 \|g extent:7
912			\|a GBV_USEFLAG_A
912			\|a SYSFLAG_A
912			\|a GBV_OLC
912			\|a SSG-OLC-TEC
912			\|a SSG-OLC-MAT
912			\|a GBV_ILN_11
912			\|a GBV_ILN_20
912			\|a GBV_ILN_22
912			\|a GBV_ILN_23
912			\|a GBV_ILN_24
912			\|a GBV_ILN_31
912			\|a GBV_ILN_32
912			\|a GBV_ILN_62
912			\|a GBV_ILN_70
912			\|a GBV_ILN_100
912			\|a GBV_ILN_2002
912			\|a GBV_ILN_2006
912			\|a GBV_ILN_2014
912			\|a GBV_ILN_2015
912			\|a GBV_ILN_2064
912			\|a GBV_ILN_2129
912			\|a GBV_ILN_2190
912			\|a GBV_ILN_2244
912			\|a GBV_ILN_4036
912			\|a GBV_ILN_4046
912			\|a GBV_ILN_4266
912			\|a GBV_ILN_4306
912			\|a GBV_ILN_4307
912			\|a GBV_ILN_4309
912			\|a GBV_ILN_4314
912			\|a GBV_ILN_4315
912			\|a GBV_ILN_4317
912			\|a GBV_ILN_4319
912			\|a GBV_ILN_4700
951			\|a AR
952			\|d 8 \|j 2000 \|e 6 \|h 717-723 \|g 7

Indexfelder

author_variant	a k ak
matchkey_str	article:10638210:2000----::pcaisenytmeeitroncpeitosirglretoppritiscekgidesbirn
hierarchy_sort_str	2000
publishDate	2000
allfields	SW010305 (DE-627)OLC1599924749 (DE-599)GBVOLC1599924749 DE-627 ger DE-627 rakwb 004 620 Keshavarzi, A. verfasserin aut SPECIAL ISSUE ON SYSTEM-LEVEL INTERCONNECT PREDICTION (SLIP) - REGULAR SECTION PAPERS - Intrinsic Leakage in Deep Submicron CMOS ICs -- Measurement-Based Test Solutions 2000 7 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Roy, K. oth Hawkins, C.F. oth Enthalten in IEEE transactions on very large scale integration (VLSI) systems New York, NY : Institute of Electrical and Electronics Engineers, 1993 8(2000), 6, Seite 717-723 (DE-627)165670282 (DE-600)1151835-2 (DE-576)034204024 1063-8210 nnns volume:8 year:2000 number:6 pages:717-723 extent:7 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_62 GBV_ILN_70 GBV_ILN_100 GBV_ILN_2002 GBV_ILN_2006 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2064 GBV_ILN_2129 GBV_ILN_2190 GBV_ILN_2244 GBV_ILN_4036 GBV_ILN_4046 GBV_ILN_4266 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4309 GBV_ILN_4314 GBV_ILN_4315 GBV_ILN_4317 GBV_ILN_4319 GBV_ILN_4700 AR 8 2000 6 717-723 7
spelling	SW010305 (DE-627)OLC1599924749 (DE-599)GBVOLC1599924749 DE-627 ger DE-627 rakwb 004 620 Keshavarzi, A. verfasserin aut SPECIAL ISSUE ON SYSTEM-LEVEL INTERCONNECT PREDICTION (SLIP) - REGULAR SECTION PAPERS - Intrinsic Leakage in Deep Submicron CMOS ICs -- Measurement-Based Test Solutions 2000 7 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Roy, K. oth Hawkins, C.F. oth Enthalten in IEEE transactions on very large scale integration (VLSI) systems New York, NY : Institute of Electrical and Electronics Engineers, 1993 8(2000), 6, Seite 717-723 (DE-627)165670282 (DE-600)1151835-2 (DE-576)034204024 1063-8210 nnns volume:8 year:2000 number:6 pages:717-723 extent:7 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_62 GBV_ILN_70 GBV_ILN_100 GBV_ILN_2002 GBV_ILN_2006 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2064 GBV_ILN_2129 GBV_ILN_2190 GBV_ILN_2244 GBV_ILN_4036 GBV_ILN_4046 GBV_ILN_4266 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4309 GBV_ILN_4314 GBV_ILN_4315 GBV_ILN_4317 GBV_ILN_4319 GBV_ILN_4700 AR 8 2000 6 717-723 7
allfields_unstemmed	SW010305 (DE-627)OLC1599924749 (DE-599)GBVOLC1599924749 DE-627 ger DE-627 rakwb 004 620 Keshavarzi, A. verfasserin aut SPECIAL ISSUE ON SYSTEM-LEVEL INTERCONNECT PREDICTION (SLIP) - REGULAR SECTION PAPERS - Intrinsic Leakage in Deep Submicron CMOS ICs -- Measurement-Based Test Solutions 2000 7 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Roy, K. oth Hawkins, C.F. oth Enthalten in IEEE transactions on very large scale integration (VLSI) systems New York, NY : Institute of Electrical and Electronics Engineers, 1993 8(2000), 6, Seite 717-723 (DE-627)165670282 (DE-600)1151835-2 (DE-576)034204024 1063-8210 nnns volume:8 year:2000 number:6 pages:717-723 extent:7 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_62 GBV_ILN_70 GBV_ILN_100 GBV_ILN_2002 GBV_ILN_2006 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2064 GBV_ILN_2129 GBV_ILN_2190 GBV_ILN_2244 GBV_ILN_4036 GBV_ILN_4046 GBV_ILN_4266 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4309 GBV_ILN_4314 GBV_ILN_4315 GBV_ILN_4317 GBV_ILN_4319 GBV_ILN_4700 AR 8 2000 6 717-723 7
allfieldsGer	SW010305 (DE-627)OLC1599924749 (DE-599)GBVOLC1599924749 DE-627 ger DE-627 rakwb 004 620 Keshavarzi, A. verfasserin aut SPECIAL ISSUE ON SYSTEM-LEVEL INTERCONNECT PREDICTION (SLIP) - REGULAR SECTION PAPERS - Intrinsic Leakage in Deep Submicron CMOS ICs -- Measurement-Based Test Solutions 2000 7 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Roy, K. oth Hawkins, C.F. oth Enthalten in IEEE transactions on very large scale integration (VLSI) systems New York, NY : Institute of Electrical and Electronics Engineers, 1993 8(2000), 6, Seite 717-723 (DE-627)165670282 (DE-600)1151835-2 (DE-576)034204024 1063-8210 nnns volume:8 year:2000 number:6 pages:717-723 extent:7 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_62 GBV_ILN_70 GBV_ILN_100 GBV_ILN_2002 GBV_ILN_2006 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2064 GBV_ILN_2129 GBV_ILN_2190 GBV_ILN_2244 GBV_ILN_4036 GBV_ILN_4046 GBV_ILN_4266 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4309 GBV_ILN_4314 GBV_ILN_4315 GBV_ILN_4317 GBV_ILN_4319 GBV_ILN_4700 AR 8 2000 6 717-723 7
allfieldsSound	SW010305 (DE-627)OLC1599924749 (DE-599)GBVOLC1599924749 DE-627 ger DE-627 rakwb 004 620 Keshavarzi, A. verfasserin aut SPECIAL ISSUE ON SYSTEM-LEVEL INTERCONNECT PREDICTION (SLIP) - REGULAR SECTION PAPERS - Intrinsic Leakage in Deep Submicron CMOS ICs -- Measurement-Based Test Solutions 2000 7 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Roy, K. oth Hawkins, C.F. oth Enthalten in IEEE transactions on very large scale integration (VLSI) systems New York, NY : Institute of Electrical and Electronics Engineers, 1993 8(2000), 6, Seite 717-723 (DE-627)165670282 (DE-600)1151835-2 (DE-576)034204024 1063-8210 nnns volume:8 year:2000 number:6 pages:717-723 extent:7 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_62 GBV_ILN_70 GBV_ILN_100 GBV_ILN_2002 GBV_ILN_2006 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2064 GBV_ILN_2129 GBV_ILN_2190 GBV_ILN_2244 GBV_ILN_4036 GBV_ILN_4046 GBV_ILN_4266 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4309 GBV_ILN_4314 GBV_ILN_4315 GBV_ILN_4317 GBV_ILN_4319 GBV_ILN_4700 AR 8 2000 6 717-723 7
source	Enthalten in IEEE transactions on very large scale integration (VLSI) systems 8(2000), 6, Seite 717-723 volume:8 year:2000 number:6 pages:717-723 extent:7
sourceStr	Enthalten in IEEE transactions on very large scale integration (VLSI) systems 8(2000), 6, Seite 717-723 volume:8 year:2000 number:6 pages:717-723 extent:7
format_phy_str_mv	Article
institution	findex.gbv.de
dewey-raw	004
isfreeaccess_bool	false
container_title	IEEE transactions on very large scale integration (VLSI) systems
authorswithroles_txt_mv	Keshavarzi, A. @@aut@@ Roy, K. @@oth@@ Hawkins, C.F. @@oth@@
publishDateDaySort_date	2000-01-01T00:00:00Z
hierarchy_top_id	165670282
dewey-sort	14
id	OLC1599924749
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC1599924749</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230706052911.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">010307s2000 xx \|\|\|\|\| 00\| \|\|und c</controlfield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">SW010305</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC1599924749</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVOLC1599924749</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">004</subfield><subfield code="a">620</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Keshavarzi, A.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">SPECIAL ISSUE ON SYSTEM-LEVEL INTERCONNECT PREDICTION (SLIP) - REGULAR SECTION PAPERS - Intrinsic Leakage in Deep Submicron CMOS ICs -- Measurement-Based Test Solutions</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2000</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">7</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Roy, K.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Hawkins, C.F.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">IEEE transactions on very large scale integration (VLSI) systems</subfield><subfield code="d">New York, NY : Institute of Electrical and Electronics Engineers, 1993</subfield><subfield code="g">8(2000), 6, Seite 717-723</subfield><subfield code="w">(DE-627)165670282</subfield><subfield code="w">(DE-600)1151835-2</subfield><subfield code="w">(DE-576)034204024</subfield><subfield code="x">1063-8210</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:8</subfield><subfield code="g">year:2000</subfield><subfield code="g">number:6</subfield><subfield code="g">pages:717-723</subfield><subfield code="g">extent:7</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-TEC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-MAT</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_11</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_20</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_22</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_23</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_24</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_31</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_32</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_62</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_100</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2002</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2006</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2014</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2015</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2064</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2129</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2190</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2244</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4036</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4046</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4266</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4306</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4307</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4309</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4314</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4315</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4317</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4319</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4700</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">8</subfield><subfield code="j">2000</subfield><subfield code="e">6</subfield><subfield code="h">717-723</subfield><subfield code="g">7</subfield></datafield></record></collection>
author	Keshavarzi, A.
spellingShingle	Keshavarzi, A. ddc 004 SPECIAL ISSUE ON SYSTEM-LEVEL INTERCONNECT PREDICTION (SLIP) - REGULAR SECTION PAPERS - Intrinsic Leakage in Deep Submicron CMOS ICs -- Measurement-Based Test Solutions
authorStr	Keshavarzi, A.
ppnlink_with_tag_str_mv	@@773@@(DE-627)165670282
format	Article
dewey-ones	004 - Data processing & computer science 620 - Engineering & allied operations
delete_txt_mv	keep
author_role	aut
collection	OLC
remote_str	false
illustrated	Not Illustrated
issn	1063-8210
topic_title	004 620 SPECIAL ISSUE ON SYSTEM-LEVEL INTERCONNECT PREDICTION (SLIP) - REGULAR SECTION PAPERS - Intrinsic Leakage in Deep Submicron CMOS ICs -- Measurement-Based Test Solutions
topic	ddc 004
topic_unstemmed	ddc 004
topic_browse	ddc 004
format_facet	Aufsätze Gedruckte Aufsätze
format_main_str_mv	Text Zeitschrift/Artikel
carriertype_str_mv	nc
author2_variant	k r kr c h ch
hierarchy_parent_title	IEEE transactions on very large scale integration (VLSI) systems
hierarchy_parent_id	165670282
dewey-tens	000 - Computer science, knowledge & systems 620 - Engineering
hierarchy_top_title	IEEE transactions on very large scale integration (VLSI) systems
isfreeaccess_txt	false
familylinks_str_mv	(DE-627)165670282 (DE-600)1151835-2 (DE-576)034204024
title	SPECIAL ISSUE ON SYSTEM-LEVEL INTERCONNECT PREDICTION (SLIP) - REGULAR SECTION PAPERS - Intrinsic Leakage in Deep Submicron CMOS ICs -- Measurement-Based Test Solutions
ctrlnum	(DE-627)OLC1599924749 (DE-599)GBVOLC1599924749
title_full	SPECIAL ISSUE ON SYSTEM-LEVEL INTERCONNECT PREDICTION (SLIP) - REGULAR SECTION PAPERS - Intrinsic Leakage in Deep Submicron CMOS ICs -- Measurement-Based Test Solutions
author_sort	Keshavarzi, A.
journal	IEEE transactions on very large scale integration (VLSI) systems
journalStr	IEEE transactions on very large scale integration (VLSI) systems
isOA_bool	false
dewey-hundreds	000 - Computer science, information & general works 600 - Technology
recordtype	marc
publishDateSort	2000
contenttype_str_mv	txt
container_start_page	717
author_browse	Keshavarzi, A.
container_volume	8
physical	7
class	004 620
format_se	Aufsätze
author-letter	Keshavarzi, A.
dewey-full	004 620
title_sort	special issue on system-level interconnect prediction (slip) - regular section papers - intrinsic leakage in deep submicron cmos ics -- measurement-based test solutions
title_auth	SPECIAL ISSUE ON SYSTEM-LEVEL INTERCONNECT PREDICTION (SLIP) - REGULAR SECTION PAPERS - Intrinsic Leakage in Deep Submicron CMOS ICs -- Measurement-Based Test Solutions
collection_details	GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_62 GBV_ILN_70 GBV_ILN_100 GBV_ILN_2002 GBV_ILN_2006 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2064 GBV_ILN_2129 GBV_ILN_2190 GBV_ILN_2244 GBV_ILN_4036 GBV_ILN_4046 GBV_ILN_4266 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4309 GBV_ILN_4314 GBV_ILN_4315 GBV_ILN_4317 GBV_ILN_4319 GBV_ILN_4700
container_issue	6
title_short	SPECIAL ISSUE ON SYSTEM-LEVEL INTERCONNECT PREDICTION (SLIP) - REGULAR SECTION PAPERS - Intrinsic Leakage in Deep Submicron CMOS ICs -- Measurement-Based Test Solutions
remote_bool	false
author2	Roy, K. Hawkins, C.F.
author2Str	Roy, K. Hawkins, C.F.
ppnlink	165670282
mediatype_str_mv	n
isOA_txt	false
hochschulschrift_bool	false
author2_role	oth oth
up_date	2024-07-03T13:54:28.163Z
_version_	1803566310397837312
fullrecord_marcxml	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC1599924749</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230706052911.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">010307s2000 xx \|\|\|\|\| 00\| \|\|und c</controlfield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">SW010305</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC1599924749</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVOLC1599924749</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">004</subfield><subfield code="a">620</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Keshavarzi, A.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">SPECIAL ISSUE ON SYSTEM-LEVEL INTERCONNECT PREDICTION (SLIP) - REGULAR SECTION PAPERS - Intrinsic Leakage in Deep Submicron CMOS ICs -- Measurement-Based Test Solutions</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2000</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">7</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Roy, K.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Hawkins, C.F.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">IEEE transactions on very large scale integration (VLSI) systems</subfield><subfield code="d">New York, NY : Institute of Electrical and Electronics Engineers, 1993</subfield><subfield code="g">8(2000), 6, Seite 717-723</subfield><subfield code="w">(DE-627)165670282</subfield><subfield code="w">(DE-600)1151835-2</subfield><subfield code="w">(DE-576)034204024</subfield><subfield code="x">1063-8210</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:8</subfield><subfield code="g">year:2000</subfield><subfield code="g">number:6</subfield><subfield code="g">pages:717-723</subfield><subfield code="g">extent:7</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-TEC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-MAT</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_11</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_20</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_22</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_23</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_24</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_31</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_32</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_62</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_100</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2002</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2006</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2014</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2015</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2064</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2129</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2190</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2244</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4036</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4046</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4266</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4306</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4307</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4309</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4314</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4315</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4317</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4319</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4700</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">8</subfield><subfield code="j">2000</subfield><subfield code="e">6</subfield><subfield code="h">717-723</subfield><subfield code="g">7</subfield></datafield></record></collection>
score	7.401865

Nicht das Richtige dabei?

Schreiben Sie uns!

SPECIAL ISSUE ON SYSTEM-LEVEL INTERCONNECT PREDICTION (SLIP) - REGULAR SECTION PAPERS - Intrinsic Leakage in Deep Submicron CMOS ICs -- Measurement-Based Test Solutions

Nicht das Richtige dabei?

Zugang & Verfügbarkeit

Vorhandene Bände

Nicht das Richtige dabei?