Read-Out Electronics and Signal Processing - Radiation Hardness of VA1 with Submicron Process Technology

Gespeichert in:

Autor*in:	Yokoyama, M. [verfasserIn] Aihara, H. Hazumi, M. Ishino, H. Kaneko, J. Li, Y. Marlow, D. Mikkelsen, S. Nygård, E. Tajima, H. Talebi, J. Varner, G. Yamamoto, H.

Format:	Artikel

Erschienen:	2001

Umfang:	4

Übergeordnetes Werk:	Enthalten in: IEEE transactions on nuclear science - New York, NY : IEEE, 1963, 48(2001), 3, 1, Seite 440-443
Übergeordnetes Werk:	volume:48 ; year:2001 ; number:3 ; supplement:1 ; pages:440-443 ; extent:4

Katalog-ID:	OLC1610378415

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allfields	SW010904 (DE-627)OLC1610378415 (DE-599)GBVOLC1610378415 DE-627 ger DE-627 rakwb 620 Yokoyama, M. verfasserin aut Read-Out Electronics and Signal Processing - Radiation Hardness of VA1 with Submicron Process Technology 2001 4 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Aihara, H. oth Hazumi, M. oth Ishino, H. oth Kaneko, J. oth Li, Y. oth Marlow, D. oth Mikkelsen, S. oth Nygård, E. oth Tajima, H. oth Talebi, J. oth Varner, G. oth Yamamoto, H. oth Enthalten in IEEE transactions on nuclear science New York, NY : IEEE, 1963 48(2001), 3, 1, Seite 440-443 (DE-627)129547352 (DE-600)218510-6 (DE-576)014998238 0018-9499 nnns volume:48 year:2001 number:3 supplement:1 pages:440-443 extent:4 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-PHA GBV_ILN_11 GBV_ILN_20 GBV_ILN_21 GBV_ILN_23 GBV_ILN_32 GBV_ILN_40 GBV_ILN_47 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2006 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2181 GBV_ILN_2279 GBV_ILN_4036 GBV_ILN_4046 GBV_ILN_4266 GBV_ILN_4305 GBV_ILN_4307 GBV_ILN_4309 GBV_ILN_4310 GBV_ILN_4314 GBV_ILN_4315 GBV_ILN_4316 GBV_ILN_4317 GBV_ILN_4318 GBV_ILN_4319 GBV_ILN_4700 AR 48 2001 3 1 440-443 4
spelling	SW010904 (DE-627)OLC1610378415 (DE-599)GBVOLC1610378415 DE-627 ger DE-627 rakwb 620 Yokoyama, M. verfasserin aut Read-Out Electronics and Signal Processing - Radiation Hardness of VA1 with Submicron Process Technology 2001 4 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Aihara, H. oth Hazumi, M. oth Ishino, H. oth Kaneko, J. oth Li, Y. oth Marlow, D. oth Mikkelsen, S. oth Nygård, E. oth Tajima, H. oth Talebi, J. oth Varner, G. oth Yamamoto, H. oth Enthalten in IEEE transactions on nuclear science New York, NY : IEEE, 1963 48(2001), 3, 1, Seite 440-443 (DE-627)129547352 (DE-600)218510-6 (DE-576)014998238 0018-9499 nnns volume:48 year:2001 number:3 supplement:1 pages:440-443 extent:4 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-PHA GBV_ILN_11 GBV_ILN_20 GBV_ILN_21 GBV_ILN_23 GBV_ILN_32 GBV_ILN_40 GBV_ILN_47 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2006 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2181 GBV_ILN_2279 GBV_ILN_4036 GBV_ILN_4046 GBV_ILN_4266 GBV_ILN_4305 GBV_ILN_4307 GBV_ILN_4309 GBV_ILN_4310 GBV_ILN_4314 GBV_ILN_4315 GBV_ILN_4316 GBV_ILN_4317 GBV_ILN_4318 GBV_ILN_4319 GBV_ILN_4700 AR 48 2001 3 1 440-443 4
allfields_unstemmed	SW010904 (DE-627)OLC1610378415 (DE-599)GBVOLC1610378415 DE-627 ger DE-627 rakwb 620 Yokoyama, M. verfasserin aut Read-Out Electronics and Signal Processing - Radiation Hardness of VA1 with Submicron Process Technology 2001 4 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Aihara, H. oth Hazumi, M. oth Ishino, H. oth Kaneko, J. oth Li, Y. oth Marlow, D. oth Mikkelsen, S. oth Nygård, E. oth Tajima, H. oth Talebi, J. oth Varner, G. oth Yamamoto, H. oth Enthalten in IEEE transactions on nuclear science New York, NY : IEEE, 1963 48(2001), 3, 1, Seite 440-443 (DE-627)129547352 (DE-600)218510-6 (DE-576)014998238 0018-9499 nnns volume:48 year:2001 number:3 supplement:1 pages:440-443 extent:4 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-PHA GBV_ILN_11 GBV_ILN_20 GBV_ILN_21 GBV_ILN_23 GBV_ILN_32 GBV_ILN_40 GBV_ILN_47 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2006 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2181 GBV_ILN_2279 GBV_ILN_4036 GBV_ILN_4046 GBV_ILN_4266 GBV_ILN_4305 GBV_ILN_4307 GBV_ILN_4309 GBV_ILN_4310 GBV_ILN_4314 GBV_ILN_4315 GBV_ILN_4316 GBV_ILN_4317 GBV_ILN_4318 GBV_ILN_4319 GBV_ILN_4700 AR 48 2001 3 1 440-443 4
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allfieldsSound	SW010904 (DE-627)OLC1610378415 (DE-599)GBVOLC1610378415 DE-627 ger DE-627 rakwb 620 Yokoyama, M. verfasserin aut Read-Out Electronics and Signal Processing - Radiation Hardness of VA1 with Submicron Process Technology 2001 4 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Aihara, H. oth Hazumi, M. oth Ishino, H. oth Kaneko, J. oth Li, Y. oth Marlow, D. oth Mikkelsen, S. oth Nygård, E. oth Tajima, H. oth Talebi, J. oth Varner, G. oth Yamamoto, H. oth Enthalten in IEEE transactions on nuclear science New York, NY : IEEE, 1963 48(2001), 3, 1, Seite 440-443 (DE-627)129547352 (DE-600)218510-6 (DE-576)014998238 0018-9499 nnns volume:48 year:2001 number:3 supplement:1 pages:440-443 extent:4 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-PHA GBV_ILN_11 GBV_ILN_20 GBV_ILN_21 GBV_ILN_23 GBV_ILN_32 GBV_ILN_40 GBV_ILN_47 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2006 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2181 GBV_ILN_2279 GBV_ILN_4036 GBV_ILN_4046 GBV_ILN_4266 GBV_ILN_4305 GBV_ILN_4307 GBV_ILN_4309 GBV_ILN_4310 GBV_ILN_4314 GBV_ILN_4315 GBV_ILN_4316 GBV_ILN_4317 GBV_ILN_4318 GBV_ILN_4319 GBV_ILN_4700 AR 48 2001 3 1 440-443 4
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title_sort	read-out electronics and signal processing - radiation hardness of va1 with submicron process technology
title_auth	Read-Out Electronics and Signal Processing - Radiation Hardness of VA1 with Submicron Process Technology
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title_short	Read-Out Electronics and Signal Processing - Radiation Hardness of VA1 with Submicron Process Technology
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author2	Aihara, H. Hazumi, M. Ishino, H. Kaneko, J. Li, Y. Marlow, D. Mikkelsen, S. Nygård, E. Tajima, H. Talebi, J. Varner, G. Yamamoto, H.
author2Str	Aihara, H. Hazumi, M. Ishino, H. Kaneko, J. Li, Y. Marlow, D. Mikkelsen, S. Nygård, E. Tajima, H. Talebi, J. Varner, G. Yamamoto, H.
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up_date	2024-07-03T13:49:12.813Z
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