Ion electron emission microscopy at the SIRAD single event effect facility

Gespeichert in:

Autor*in:	Bisello, D. [verfasserIn] Kaminsky, A. Magalini, A. Nigro, M. Pantano, D. Sedykh, S. Wyss, J.

Format:	Artikel

Erschienen:	2001

Systematik:	UA 5680.

Umfang:	4

Übergeordnetes Werk:	Enthalten in: Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms - Amsterdam [u.a.] : Elsevier, 1984, 181(2001), Seite 254-257
Übergeordnetes Werk:	volume:181 ; year:2001 ; pages:254-257 ; extent:4

Katalog-ID:	OLC1611038677

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