A pseudo top-hat mathematical morphological approach to edge detection in dark regions

Gespeichert in:

Autor*in:	Chen, T. [verfasserIn] Wu, Q.H. Rahmani-Torkaman, R. Hughes, J.

Format:	Artikel

Erschienen:	2002

Umfang:	12

Übergeordnetes Werk:	Enthalten in: Pattern recognition - Amsterdam [u.a.] : Elsevier, 1968, 35(2002), 1, Seite 199-210
Übergeordnetes Werk:	volume:35 ; year:2002 ; number:1 ; pages:199-210 ; extent:12

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A pseudo top-hat mathematical morphological approach to edge detection in dark regions

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