Multiple-view line-scan imaging

Gespeichert in:

Autor*in:	Hon, H.W. [verfasserIn] Evans, J.P.O.

Format:	Artikel

Erschienen:	2002

Umfang:	6

Übergeordnetes Werk:	Enthalten in: IEE proceedings / Optoelectronics - London : Inst., 1994, 149(2002), 2, Seite 45-50
Übergeordnetes Werk:	volume:149 ; year:2002 ; number:2 ; pages:45-50 ; extent:6

Katalog-ID:	OLC1628480149

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Multiple-view line-scan imaging

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Zugang & Verfügbarkeit

Vorhandene Bände

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