Thickness and composition dependence of microwave properties of YBCO thin films on CeO2-buffered sapphire substrates

Gespeichert in:

Autor*in:	Kawagishi, K. [verfasserIn] Komori, K. Fukutomi, M. Togano, K.

Format:	Artikel

Erschienen:	2002

Umfang:	4

Übergeordnetes Werk:	Enthalten in: Physica / C - Amsterdam : North-Holland Physics Publ., 1988, 372(2002), 1, Seite 659-662
Übergeordnetes Werk:	volume:372 ; year:2002 ; supplement:1 ; pages:659-662 ; extent:4

Katalog-ID:	OLC1629842842

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title	Thickness and composition dependence of microwave properties of YBCO thin films on CeO2-buffered sapphire substrates
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title_auth	Thickness and composition dependence of microwave properties of YBCO thin films on CeO2-buffered sapphire substrates
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Thickness and composition dependence of microwave properties of YBCO thin films on CeO2-buffered sapphire substrates

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