Measurement of the actual properties of matrix in the SiCw-6061Al composite by X-ray diffraction

Gespeichert in:

Autor*in:	Jiang, C.H. [verfasserIn] Wu, J.S.

Format:	Artikel

Erschienen:	2002

Umfang:	4

Übergeordnetes Werk:	Enthalten in: Materials letters - New York, NY [u.a.] : Elsevier, 1982, 56(2002), 6, Seite 1003-1006
Übergeordnetes Werk:	volume:56 ; year:2002 ; number:6 ; pages:1003-1006 ; extent:4

Katalog-ID:	OLC1632643723

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