SIMS depth profiling of InGaAsN-InAlAs quantum wells on InP

Gespeichert in:

Autor*in:	Maier, M. [verfasserIn] Serries, D. Geppert, T. Köhler, K. Güllich, H. Herres, N.

Format:	Artikel

Erschienen:	2003

Umfang:	4

Übergeordnetes Werk:	Enthalten in: Applied surface science - Amsterdam [u.a.] : Elsevier, 1985, 203(2003), Seite 486-489
Übergeordnetes Werk:	volume:203 ; year:2003 ; pages:486-489 ; extent:4

Katalog-ID:	OLC1636017509

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spelling	SW030113 (DE-627)OLC1636017509 (DE-599)GBVOLC1636017509 DE-627 ger DE-627 rakwb 670 530 660 Maier, M. verfasserin aut SIMS depth profiling of InGaAsN-InAlAs quantum wells on InP 2003 4 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Serries, D. oth Geppert, T. oth Köhler, K. oth Güllich, H. oth Herres, N. oth Enthalten in Applied surface science Amsterdam [u.a.] : Elsevier, 1985 203(2003), Seite 486-489 (DE-627)129187496 (DE-600)52886-9 (DE-576)014456311 0169-4332 nnns volume:203 year:2003 pages:486-489 extent:4 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-CHE SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_22 GBV_ILN_24 GBV_ILN_32 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_4266 GBV_ILN_4307 AR 203 2003 486-489 4
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