Transient dynamic analysis of a cracked functionally graded material by a BIEM

Gespeichert in:

Autor*in:	Zhang, Ch [verfasserIn] Savaidis, A. Savaidis, G. Zhu, H.

Format:	Artikel

Erschienen:	2003

Umfang:	8

Übergeordnetes Werk:	Enthalten in: Computational materials science - Amsterdam [u.a.] : Elsevier, 1992, 26(2003), Seite 167-174
Übergeordnetes Werk:	volume:26 ; year:2003 ; pages:167-174 ; extent:8

Katalog-ID:	OLC1642461377

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