Measurement of microthermal deformations in an optical pick-up base using holographic interferometry

Gespeichert in:

Autor*in:	Seo, Youngmin [verfasserIn] Cho, Sunghoon Kang, Shinill

Format:	Artikel

Erschienen:	2003

Umfang:	6

Übergeordnetes Werk:	Enthalten in: Optical engineering - Bellingham, Wash. : SPIE, 1972, 42(2003), 11, Seite 3198-3203
Übergeordnetes Werk:	volume:42 ; year:2003 ; number:11 ; pages:3198-3203 ; extent:6

Katalog-ID:	OLC1652594027

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Measurement of microthermal deformations in an optical pick-up base using holographic interferometry

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