Measurement of Electric-Field Intensities Using Scanning Near-Field Microwave Microscopy

Gespeichert in:

Autor*in:	Kantor, R. [verfasserIn] Shvets, I.V.

Format:	Artikel

Erschienen:	2003

Umfang:	7

Übergeordnetes Werk:	Enthalten in: IEEE transactions on microwave theory and techniques - New York, NY : IEEE, 1963, 51(2003), 11, Seite 2228-2234
Übergeordnetes Werk:	volume:51 ; year:2003 ; number:11 ; pages:2228-2234 ; extent:7

Katalog-ID:	OLC1653135565

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