Bayesian inference of linear sine-fitting parameters from integrating digital voltmeter data

Gespeichert in:

Autor*in:	Kyriazis, G.A. [verfasserIn] Campos, M.L.R.de

Format:	Artikel

Erschienen:	2004

Umfang:	10

Übergeordnetes Werk:	Enthalten in: Measurement science and technology - Bristol : IOP Publ. Ltd., 1990, 15(2004), 2, Seite 337-346
Übergeordnetes Werk:	volume:15 ; year:2004 ; number:2 ; pages:337-346 ; extent:10

Katalog-ID:	OLC1655804588

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