Radiation damage effects in the NA60 silicon pixel detectors

Gespeichert in:

Autor*in:	Keil, M. [verfasserIn] Banicz, K. Floris, M. Heuser, J.M. Lourenço, C. Ohnishi, H. Radermacher, E. Usai, G.

Format:	Artikel

Erschienen:	2005

Systematik:	UA 5680.

Umfang:	6

Übergeordnetes Werk:	Enthalten in: Nuclear instruments & methods in physics research / A - Amsterdam : North-Holland Publ. Co., 1984, 552(2005), 1, Seite 239-244
Übergeordnetes Werk:	volume:552 ; year:2005 ; number:1 ; pages:239-244 ; extent:6

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