Diffusion Systems: Stability, Modeling, and Identification

Gespeichert in:

Autor*in:	Pintelon, R. [verfasserIn] Schoukens, J. Pauwels, L. Gheem, E.Van

Format:	Artikel

Erschienen:	2005

Umfang:	7

Übergeordnetes Werk:	Enthalten in: IEEE transactions on instrumentation and measurement - New York, NY, 1963, 54(2005), 5, Seite 2061-2067
Übergeordnetes Werk:	volume:54 ; year:2005 ; number:5 ; pages:2061-2067 ; extent:7

Katalog-ID:	OLC1684110521

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