Silicon Devices - A Study of Hot-Hole Injection During Programming Drain Disturb in Flash Memories

Gespeichert in:

Autor*in:	Ielmini, D. [verfasserIn] Ghetti, A. Spinelli, A.S. Visconti, A.

Format:	Artikel

Erschienen:	2006

Umfang:	9

Übergeordnetes Werk:	Enthalten in: IEEE transactions on electron devices - New York, NY : IEEE, 1963, 53(2006), 4, Seite 668-676
Übergeordnetes Werk:	volume:53 ; year:2006 ; number:4 ; pages:668-676 ; extent:9

Katalog-ID:	OLC1696114748

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