Assessment of deep levels in photorefractive matenals by transient photoelectric methods.

Gespeichert in:

Autor*in:	Zielinger, J.P. [verfasserIn] Tapiero, M.

Format:	Artikel

Erschienen:	1993

Umfang:	18

Übergeordnetes Werk:	Enthalten in: The European physical journal / Applied physics - Les Ulis : EDP Sciences, 1951, 3(1993), 7, Seite 1327-1344
Übergeordnetes Werk:	volume:3 ; year:1993 ; number:7 ; pages:1327-1344 ; extent:18

Katalog-ID:	OLC1699208468

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allfields	(DE-627)OLC1699208468 (DE-599)GBVOLC1699208468 DE-627 ger DE-627 rakwb 33.18 bkl 33.00 bkl 33.18 bkl 33.00 bkl Zielinger, J.P. verfasserin aut Assessment of deep levels in photorefractive matenals by transient photoelectric methods. 1993 18 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Tapiero, M. oth Enthalten in The European physical journal / Applied physics Les Ulis : EDP Sciences, 1951 3(1993), 7, Seite 1327-1344 (DE-627)058996737 nnns volume:3 year:1993 number:7 pages:1327-1344 extent:18 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_31 33.18 AVZ 33.00 AVZ 33.18 Optik Optik VZ 33.00 VZ AR 3 1993 7 1327-1344 18
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