Quantification in low-energy ion scattering: elemental sensitivity factors and charge exchange processes

Gespeichert in:

Autor*in:	Mikhailov, S.N. [verfasserIn] Elfrink, R.J.M. Jacobs, J.-P. Oetelaar, L.C.A.van den Scanlon, P.J. Brongersma, H.H.

Format:	Artikel

Erschienen:	1994

Systematik:	UA 5680.

Umfang:	7

Übergeordnetes Werk:	Enthalten in: Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms - Amsterdam [u.a.] : Elsevier, 1984, 93(1994), 2, Seite 149-155
Übergeordnetes Werk:	volume:93 ; year:1994 ; number:2 ; pages:149-155 ; extent:7

Katalog-ID:	OLC1711460494

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Quantification in low-energy ion scattering: elemental sensitivity factors and charge exchange processes

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