Intensity noise measurement of strongly attenuated laser diode pulses in the time domain

Gespeichert in:

Autor*in:	Xuân, Quyên [verfasserIn] Alléaume, R. Xiao, Liantuan Treussart, F. Journet, B. Roch, J.-F.

Format:	Artikel

Erschienen:	2006

Umfang:	6

Übergeordnetes Werk:	Enthalten in: The European physical journal / Applied physics - Les Ulis : EDP Sciences, 1951, 35(2006), 2, Seite 117-122
Übergeordnetes Werk:	volume:35 ; year:2006 ; number:2 ; pages:117-122 ; extent:6

Katalog-ID:	OLC1723667544

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