RADIATION DAMAGE EFFECTS - Bulk Damage in DMILL npn Bipolar Transistors Caused by Thermal Neutrons Versus Protons and Fast Neutrons

Gespeichert in:

Autor*in:	Mandic, I. [verfasserIn] Cindro, V. Kramberger, G. Kristof, E.S. Mikuz, M. Vrtacnik, D. Ullan, M. Anghinolfi, F.

Format:	Artikel

Erschienen:	2004

Umfang:	7

Übergeordnetes Werk:	Enthalten in: IEEE transactions on nuclear science - New York, NY : IEEE, 1963, 51(2004), 4, 1, Seite 1752-1758
Übergeordnetes Werk:	volume:51 ; year:2004 ; number:4 ; supplement:1 ; pages:1752-1758 ; extent:7

Katalog-ID:	OLC1728010462

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allfieldsGer	sw040903 (DE-627)OLC1728010462 (DE-599)GBVOLC1728010462 DE-627 ger DE-627 rakwb 620 Mandic, I. verfasserin aut RADIATION DAMAGE EFFECTS - Bulk Damage in DMILL npn Bipolar Transistors Caused by Thermal Neutrons Versus Protons and Fast Neutrons 2004 7 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Cindro, V. oth Kramberger, G. oth Kristof, E.S. oth Mikuz, M. oth Vrtacnik, D. oth Ullan, M. oth Anghinolfi, F. oth Enthalten in IEEE transactions on nuclear science New York, NY : IEEE, 1963 51(2004), 4, 1, Seite 1752-1758 (DE-627)129547352 (DE-600)218510-6 (DE-576)014998238 0018-9499 nnns volume:51 year:2004 number:4 supplement:1 pages:1752-1758 extent:7 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-PHA GBV_ILN_21 GBV_ILN_23 GBV_ILN_40 GBV_ILN_47 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2014 GBV_ILN_2181 GBV_ILN_2279 GBV_ILN_4266 GBV_ILN_4305 GBV_ILN_4307 GBV_ILN_4317 GBV_ILN_4318 AR 51 2004 4 1 1752-1758 7
allfieldsSound	sw040903 (DE-627)OLC1728010462 (DE-599)GBVOLC1728010462 DE-627 ger DE-627 rakwb 620 Mandic, I. verfasserin aut RADIATION DAMAGE EFFECTS - Bulk Damage in DMILL npn Bipolar Transistors Caused by Thermal Neutrons Versus Protons and Fast Neutrons 2004 7 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Cindro, V. oth Kramberger, G. oth Kristof, E.S. oth Mikuz, M. oth Vrtacnik, D. oth Ullan, M. oth Anghinolfi, F. oth Enthalten in IEEE transactions on nuclear science New York, NY : IEEE, 1963 51(2004), 4, 1, Seite 1752-1758 (DE-627)129547352 (DE-600)218510-6 (DE-576)014998238 0018-9499 nnns volume:51 year:2004 number:4 supplement:1 pages:1752-1758 extent:7 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-PHA GBV_ILN_21 GBV_ILN_23 GBV_ILN_40 GBV_ILN_47 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2014 GBV_ILN_2181 GBV_ILN_2279 GBV_ILN_4266 GBV_ILN_4305 GBV_ILN_4307 GBV_ILN_4317 GBV_ILN_4318 AR 51 2004 4 1 1752-1758 7
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RADIATION DAMAGE EFFECTS - Bulk Damage in DMILL npn Bipolar Transistors Caused by Thermal Neutrons Versus Protons and Fast Neutrons

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