A new total reflection X-ray fluorescence vacuum chamber with sample changer analysis using a silicon drift detector for chemical analysis

Gespeichert in:

Autor*in:	Streli, C. [verfasserIn] Wobrauschek, P. Pepponi, G. Zoeger, N.

Format:	Artikel

Erschienen:	2004

Umfang:	6

Übergeordnetes Werk:	Enthalten in: Spectrochimica acta / B - Amsterdam [u.a.] : Elsevier, 1967, 59(2004), 8, Seite 1199-1204
Übergeordnetes Werk:	volume:59 ; year:2004 ; number:8 ; pages:1199-1204 ; extent:6

Katalog-ID:	OLC1730591426

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