SELECTED PAPERS FROM 2003 CHINESE NATIONAL SYMPOSIUM ON XRD - UACIEM: A new method to extract reliable intensities of nonequivalent systematical overlapping reflections from powder diffraction data

Gespeichert in:

Autor*in:	Ma, H.W. [verfasserIn] Liang, J.K. Liu, G.Y. Rao, G.H.

Format:	Artikel

Erschienen:	2004

Umfang:	7

Übergeordnetes Werk:	Enthalten in: Powder diffraction - Swarthmore, Pa. : JCPDS, 1986, 19(2004), 4, Seite 333-339
Übergeordnetes Werk:	volume:19 ; year:2004 ; number:4 ; pages:333-339 ; extent:7

Katalog-ID:	OLC1734886455

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