Domain configurations due to multiple misfit relaxation mechanisms in epitaxial ferroelectric thin films. II. Experimental verification and implications

Gespeichert in:

Autor*in:	Speck, J.S. [verfasserIn] Seifert, A. Pompe, W. Ramesh, R.

Format:	Artikel

Erschienen:	1994

Umfang:	7

Übergeordnetes Werk:	Enthalten in: Journal of applied physics - Melville, NY : AIP, 1937, 76(1994), 1, Seite 477-483
Übergeordnetes Werk:	volume:76 ; year:1994 ; number:1 ; pages:477-483 ; extent:7

Katalog-ID:	OLC1740532112

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Domain configurations due to multiple misfit relaxation mechanisms in epitaxial ferroelectric thin films. II. Experimental verification and implications

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