Active silicon x-ray filter for measuring electron temperature

Gespeichert in:

Autor*in:	Snider, R.T. [verfasserIn]

Format:	Artikel

Erschienen:	1995

Umfang:	3

Übergeordnetes Werk:	Enthalten in: Review of scientific instruments - Melville, NY : AIP, 1930, 66(1995), 1, 2, Seite 546-548
Übergeordnetes Werk:	volume:66 ; year:1995 ; number:1 ; supplement:2 ; pages:546-548 ; extent:3

Katalog-ID:	OLC1750155362

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spelling	(DE-627)OLC1750155362 (DE-599)GBVOLC1750155362 DE-627 ger DE-627 rakwb 530 620 Snider, R.T. verfasserin aut Active silicon x-ray filter for measuring electron temperature 1995 3 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Enthalten in Review of scientific instruments Melville, NY : AIP, 1930 66(1995), 1, 2, Seite 546-548 (DE-627)129509175 (DE-600)209865-9 (DE-576)014915782 0034-6748 nnns volume:66 year:1995 number:1 supplement:2 pages:546-548 extent:3 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_30 GBV_ILN_31 GBV_ILN_40 GBV_ILN_47 GBV_ILN_59 GBV_ILN_62 GBV_ILN_65 GBV_ILN_70 GBV_ILN_130 GBV_ILN_150 GBV_ILN_170 GBV_ILN_2002 GBV_ILN_2006 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2016 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2027 GBV_ILN_2185 GBV_ILN_2219 GBV_ILN_2221 GBV_ILN_2279 GBV_ILN_4012 GBV_ILN_4082 GBV_ILN_4126 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4310 GBV_ILN_4313 GBV_ILN_4315 GBV_ILN_4319 GBV_ILN_4323 GBV_ILN_4336 GBV_ILN_4700 AR 66 1995 1 2 546-548 3
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allfieldsGer	(DE-627)OLC1750155362 (DE-599)GBVOLC1750155362 DE-627 ger DE-627 rakwb 530 620 Snider, R.T. verfasserin aut Active silicon x-ray filter for measuring electron temperature 1995 3 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Enthalten in Review of scientific instruments Melville, NY : AIP, 1930 66(1995), 1, 2, Seite 546-548 (DE-627)129509175 (DE-600)209865-9 (DE-576)014915782 0034-6748 nnns volume:66 year:1995 number:1 supplement:2 pages:546-548 extent:3 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_30 GBV_ILN_31 GBV_ILN_40 GBV_ILN_47 GBV_ILN_59 GBV_ILN_62 GBV_ILN_65 GBV_ILN_70 GBV_ILN_130 GBV_ILN_150 GBV_ILN_170 GBV_ILN_2002 GBV_ILN_2006 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2016 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2027 GBV_ILN_2185 GBV_ILN_2219 GBV_ILN_2221 GBV_ILN_2279 GBV_ILN_4012 GBV_ILN_4082 GBV_ILN_4126 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4310 GBV_ILN_4313 GBV_ILN_4315 GBV_ILN_4319 GBV_ILN_4323 GBV_ILN_4336 GBV_ILN_4700 AR 66 1995 1 2 546-548 3
allfieldsSound	(DE-627)OLC1750155362 (DE-599)GBVOLC1750155362 DE-627 ger DE-627 rakwb 530 620 Snider, R.T. verfasserin aut Active silicon x-ray filter for measuring electron temperature 1995 3 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Enthalten in Review of scientific instruments Melville, NY : AIP, 1930 66(1995), 1, 2, Seite 546-548 (DE-627)129509175 (DE-600)209865-9 (DE-576)014915782 0034-6748 nnns volume:66 year:1995 number:1 supplement:2 pages:546-548 extent:3 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_30 GBV_ILN_31 GBV_ILN_40 GBV_ILN_47 GBV_ILN_59 GBV_ILN_62 GBV_ILN_65 GBV_ILN_70 GBV_ILN_130 GBV_ILN_150 GBV_ILN_170 GBV_ILN_2002 GBV_ILN_2006 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2016 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2027 GBV_ILN_2185 GBV_ILN_2219 GBV_ILN_2221 GBV_ILN_2279 GBV_ILN_4012 GBV_ILN_4082 GBV_ILN_4126 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4310 GBV_ILN_4313 GBV_ILN_4315 GBV_ILN_4319 GBV_ILN_4323 GBV_ILN_4336 GBV_ILN_4700 AR 66 1995 1 2 546-548 3
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Active silicon x-ray filter for measuring electron temperature

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