Domain configurations due to multiple misfit relaxation mechanisms in epitaxial ferroelectric thin films. III. Interfacial defects and domain misorientations

Gespeichert in:

Autor*in:	Speck, J.S. [verfasserIn] Daykin, A.C. Seifert, A. Romanov, A.E. Pompe, W.

Format:	Artikel

Erschienen:	1995

Umfang:	11

Übergeordnetes Werk:	Enthalten in: Journal of applied physics - Melville, NY : AIP, 1937, 78(1995), 3, Seite 1696-1706
Übergeordnetes Werk:	volume:78 ; year:1995 ; number:3 ; pages:1696-1706 ; extent:11

Katalog-ID:	OLC1760119377

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title_sort	domain configurations due to multiple misfit relaxation mechanisms in epitaxial ferroelectric thin films. iii. interfacial defects and domain misorientations
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Domain configurations due to multiple misfit relaxation mechanisms in epitaxial ferroelectric thin films. III. Interfacial defects and domain misorientations

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