HCI degradation model based on the diffusion equation including the MVHR model

Gespeichert in:

Autor*in:	Lachenal, D. [verfasserIn] Monsieur, F. Rey-Tauriac, Y. Bravaix, A.

Format:	Artikel

Erschienen:	2007

Umfang:	4

Übergeordnetes Werk:	Enthalten in: Microelectronic engineering - Amsterdam [u.a.] : Elsevier, 1983, 84(2007), 9, Seite 1921-1924
Übergeordnetes Werk:	volume:84 ; year:2007 ; number:9 ; pages:1921-1924 ; extent:4

Katalog-ID:	OLC1769586733

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