Integration of prior knowledge of measurement noise in kernel density classification

Gespeichert in:

Autor*in:	Li, Yunlei [verfasserIn] de Ridder, Dick Duin, Robert P.W. Reinders, Marcel J.T.

Format:	Artikel

Erschienen:	2008

Umfang:	11

Übergeordnetes Werk:	Enthalten in: Pattern recognition - Amsterdam [u.a.] : Elsevier, 1968, 41(2008), 1, Seite 320-330
Übergeordnetes Werk:	volume:41 ; year:2008 ; number:1 ; pages:320-330 ; extent:11

Katalog-ID:	OLC1785386298

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