A New Method for RTS Noise of Semiconductor Devices Identification

Gespeichert in:

Autor*in:	Konczakowska, A. [verfasserIn] Cichosz, J. Szewczyk, A.

Format:	Artikel

Erschienen:	2008

Umfang:	8

Übergeordnetes Werk:	Enthalten in: IEEE transactions on instrumentation and measurement - New York, NY, 1963, 57(2008), 6, Seite 1199-1206
Übergeordnetes Werk:	volume:57 ; year:2008 ; number:6 ; pages:1199-1206 ; extent:8

Katalog-ID:	OLC1793533806

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