A New Method for RTS Noise of Semiconductor Devices Identification
Autor*in: |
Konczakowska, A. [verfasserIn] |
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Format: |
Artikel |
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Erschienen: |
2008 |
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Umfang: |
8 |
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Übergeordnetes Werk: |
Enthalten in: IEEE transactions on instrumentation and measurement - New York, NY, 1963, 57(2008), 6, Seite 1199-1206 |
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Übergeordnetes Werk: |
volume:57 ; year:2008 ; number:6 ; pages:1199-1206 ; extent:8 |
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OLC1793533806 |
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sw080519 (DE-627)OLC1793533806 (DE-599)GBVOLC1793533806 DE-627 ger DE-627 rakwb 620 50.21 bkl 53.00 bkl Konczakowska, A. verfasserin aut A New Method for RTS Noise of Semiconductor Devices Identification 2008 8 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Cichosz, J. oth Szewczyk, A. oth Enthalten in IEEE transactions on instrumentation and measurement New York, NY, 1963 57(2008), 6, Seite 1199-1206 (DE-627)129358576 (DE-600)160442-9 (DE-576)014730863 0018-9456 nnns volume:57 year:2008 number:6 pages:1199-1206 extent:8 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_21 GBV_ILN_24 GBV_ILN_30 GBV_ILN_70 GBV_ILN_150 GBV_ILN_170 GBV_ILN_2014 GBV_ILN_2061 GBV_ILN_4317 GBV_ILN_4323 50.21 AVZ 53.00 AVZ AR 57 2008 6 1199-1206 8 |
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sw080519 (DE-627)OLC1793533806 (DE-599)GBVOLC1793533806 DE-627 ger DE-627 rakwb 620 50.21 bkl 53.00 bkl Konczakowska, A. verfasserin aut A New Method for RTS Noise of Semiconductor Devices Identification 2008 8 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Cichosz, J. oth Szewczyk, A. oth Enthalten in IEEE transactions on instrumentation and measurement New York, NY, 1963 57(2008), 6, Seite 1199-1206 (DE-627)129358576 (DE-600)160442-9 (DE-576)014730863 0018-9456 nnns volume:57 year:2008 number:6 pages:1199-1206 extent:8 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_21 GBV_ILN_24 GBV_ILN_30 GBV_ILN_70 GBV_ILN_150 GBV_ILN_170 GBV_ILN_2014 GBV_ILN_2061 GBV_ILN_4317 GBV_ILN_4323 50.21 AVZ 53.00 AVZ AR 57 2008 6 1199-1206 8 |
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sw080519 (DE-627)OLC1793533806 (DE-599)GBVOLC1793533806 DE-627 ger DE-627 rakwb 620 50.21 bkl 53.00 bkl Konczakowska, A. verfasserin aut A New Method for RTS Noise of Semiconductor Devices Identification 2008 8 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Cichosz, J. oth Szewczyk, A. oth Enthalten in IEEE transactions on instrumentation and measurement New York, NY, 1963 57(2008), 6, Seite 1199-1206 (DE-627)129358576 (DE-600)160442-9 (DE-576)014730863 0018-9456 nnns volume:57 year:2008 number:6 pages:1199-1206 extent:8 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_21 GBV_ILN_24 GBV_ILN_30 GBV_ILN_70 GBV_ILN_150 GBV_ILN_170 GBV_ILN_2014 GBV_ILN_2061 GBV_ILN_4317 GBV_ILN_4323 50.21 AVZ 53.00 AVZ AR 57 2008 6 1199-1206 8 |
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