Microstructural analysis and mechanical properties of TaN–Ag nanocomposite thin films

Gespeichert in:

Autor*in:	Tseng, C.C. [verfasserIn] Hsieh, J.H. Jang, S.C. Chang, Y.Y. Wu, W.

Format:	Artikel

Erschienen:	2009

Umfang:	5

Übergeordnetes Werk:	Enthalten in: Thin solid films - Amsterdam [u.a.] Elsevier, 1967, 517(2009), 17, Seite 4970-4974
Übergeordnetes Werk:	volume:517 ; year:2009 ; number:17 ; pages:4970-4974 ; extent:5

Katalog-ID:	OLC1818374366

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