Microwave surface impedance measurements of Sr2RuO4: The effect of impurities (8 pages)

Gespeichert in:

Autor*in:	Baker, P.J. [verfasserIn] Ormeno, R.J. Gough, C.E. Mao, Z.Q. Nishizaki, S. Maeno, Y.

Format:	Artikel

Erschienen:	2009

Systematik:	UA 6500.

Umfang:	1

Übergeordnetes Werk:	Enthalten in: Physical review / B - Ridge, NY : APS, 1970, 80(2009), 11, Seite 115126
Übergeordnetes Werk:	volume:80 ; year:2009 ; number:11 ; pages:115126 ; extent:1

Katalog-ID:	OLC1828860174

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Microwave surface impedance measurements of Sr2RuO4: The effect of impurities (8 pages)

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