Large-signal analysis of substrate effects in RF-power SOI-LDMOS transistors

Gespeichert in:

Autor*in:	Urban, C. [verfasserIn] Sandow, C. Zhao, Q.-T. Knoch, J. Lenk, S. Mantl, S.

Format:	Artikel

Erschienen:	2010

Umfang:	7

Übergeordnetes Werk:	Enthalten in: Solid state electronics - Amsterdam [u.a.] : Elsevier, 1960, 54(2010), 2 vom: Feb., Seite 171-178
Übergeordnetes Werk:	volume:54 ; year:2010 ; number:2 ; month:02 ; pages:171-178 ; extent:7

Katalog-ID:	OLC1835751334

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title_short	Large-signal analysis of substrate effects in RF-power SOI-LDMOS transistors
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Large-signal analysis of substrate effects in RF-power SOI-LDMOS transistors

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