Capabilities of using white x-rays for the reconstruction of surface morphology from coherent reflectivity

Gespeichert in:

Autor*in:	Sant, Tushar [verfasserIn] Panzner, Tobias Pietsch, Ullrich

Format:	Artikel

Erschienen:	2010

Umfang:	5

Übergeordnetes Werk:	Enthalten in: Applied surface science - Amsterdam [u.a.] : Elsevier, 1985, 257(2010), 1 vom: 15. Okt., Seite 266-271
Übergeordnetes Werk:	volume:257 ; year:2010 ; number:1 ; day:15 ; month:10 ; pages:266-271 ; extent:5

Katalog-ID:	OLC184700010X

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title_short	Capabilities of using white x-rays for the reconstruction of surface morphology from coherent reflectivity
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