Study of defects in implanted silica glass by depth profiling Positron Annihilation Spectroscopy
Gespeichert in:
| Autor*in: |
Brusa, R.S. [verfasserIn] |
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| Format: |
Artikel |
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| Erschienen: |
2010 |
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| Systematik: |
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| Umfang: |
5 |
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| Übergeordnetes Werk: |
Enthalten in: Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms - Amsterdam [u.a.] : Elsevier, 1984, 268(2010), 19 vom: 1. Okt., Seite 3186-3191 |
|---|---|
| Übergeordnetes Werk: |
volume:268 ; year:2010 ; number:19 ; day:1 ; month:10 ; pages:3186-3191 ; extent:5 |
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