Influence of Annealing Process on Crystalline, Microstructure, and Ferroelectric Properties of PSTT5 Thin Films

Gespeichert in:

Autor*in:	LI, Xuedong [verfasserIn] Sun, Yucheng Liu, Hong Zhu, Jiliang Guo, Hongli Xiao, Dingquan Zhu, Jianguo

Format:	Artikel

Erschienen:	2009

Umfang:	165

Übergeordnetes Werk:	Enthalten in: Ferroelectrics - Philadelphia, Pa. : Taylor & Francis, 1970, 384(2009), 1 vom: Juni, Seite 1-166
Übergeordnetes Werk:	volume:384 ; year:2009 ; number:1 ; month:06 ; pages:1-166 ; extent:165

Katalog-ID:	OLC1849529329

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spelling	sw100923_1 (DE-627)OLC1849529329 (DE-599)GBVOLC1849529329 DE-627 ger DE-627 rakwb 530 620 LI, Xuedong verfasserin aut Influence of Annealing Process on Crystalline, Microstructure, and Ferroelectric Properties of PSTT5 Thin Films 2009 165 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Sun, Yucheng oth Liu, Hong oth Zhu, Jiliang oth Guo, Hongli oth Xiao, Dingquan oth Zhu, Jianguo oth Enthalten in Ferroelectrics Philadelphia, Pa. : Taylor & Francis, 1970 384(2009), 1 vom: Juni, Seite 1-166 (DE-627)129356948 (DE-600)160137-4 (DE-576)014728990 0015-0193 nnns volume:384 year:2009 number:1 month:06 pages:1-166 extent:165 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_70 GBV_ILN_4314 AR 384 2009 1 6 1-166 165
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