Effect of Surface Degradation on Slot Partial Discharge Activity

Gespeichert in:

Autor*in:	Lévesque, M [verfasserIn] David, E Hudon, C Bélec, M

Format:	Artikel

Erschienen:	2010

Umfang:	13

Übergeordnetes Werk:	Enthalten in: IEEE transactions on dielectrics and electrical insulation - New York, NY : IEEE, 1965, 17(2010), 5, Seite 1428-1441
Übergeordnetes Werk:	volume:17 ; year:2010 ; number:5 ; pages:1428-1441 ; extent:13

Katalog-ID:	OLC185115504X

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