Electrical modulus analysis on the Ni/CCTO/PVDF system near the percolation threshold

Gespeichert in:

Autor*in:	Yang, Wenhu [verfasserIn] Yu, Shuhui Sun, Rong Ke, Shanming Huang, Haitao Du, Ruxu

Format:	Artikel

Erschienen:	2011

Umfang:	1

Übergeordnetes Werk:	Enthalten in: Journal of physics. D, Applied physics - Bristol : IOP Publ., 1970, 44(2011), 47 vom: 30. Nov., Seite 475305-475306
Übergeordnetes Werk:	volume:44 ; year:2011 ; number:47 ; day:30 ; month:11 ; pages:475305-475306 ; extent:1

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Electrical modulus analysis on the Ni/CCTO/PVDF system near the percolation threshold

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