2 dimensional electron gas uniformity of GaN HFET layers on SiC
Autor*in: |
Wallis, D.J. [verfasserIn] |
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Format: |
Artikel |
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Erschienen: |
2012 |
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Umfang: |
4 |
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Übergeordnetes Werk: |
Enthalten in: Journal of crystal growth - Amsterdam [u.a.] : Elsevier, 1967, 338(2012), 1 vom: 1. Jan., Seite 125-129 |
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Übergeordnetes Werk: |
volume:338 ; year:2012 ; number:1 ; day:1 ; month:01 ; pages:125-129 ; extent:4 |
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OLC1886084270 |
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sw120113_4 (DE-627)OLC1886084270 (DE-599)GBVOLC1886084270 DE-627 ger DE-627 rakwb 540 Wallis, D.J. verfasserin aut 2 dimensional electron gas uniformity of GaN HFET layers on SiC 2012 4 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Wright, P.J. oth Soley, D.E.J. oth Koker, L. oth Uren, M.J. oth Martin, T. oth Enthalten in Journal of crystal growth Amsterdam [u.a.] : Elsevier, 1967 338(2012), 1 vom: 1. Jan., Seite 125-129 (DE-627)129078514 (DE-600)3043-0 (DE-576)014411075 0022-0248 nnns volume:338 year:2012 number:1 day:1 month:01 pages:125-129 extent:4 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY SSG-OLC-CHE SSG-OLC-GEO SSG-OLC-PHA SSG-OLC-DE-84 SSG-OPC-GGO GBV_ILN_22 GBV_ILN_70 GBV_ILN_2004 GBV_ILN_4012 AR 338 2012 1 1 1 125-129 4 |
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