A dynamic jitter model to evaluate uncertainty trends with technology scaling

Gespeichert in:

Autor*in:	Figueiredo, Mónica [verfasserIn] Aguiar, Rui L.

Format:	Artikel

Erschienen:	2012

Umfang:	10

Übergeordnetes Werk:	Enthalten in: Integration - Amsterdam [u.a.] : Elsevier, 1983, 45(2012), 2 vom: März, Seite 162-172
Übergeordnetes Werk:	volume:45 ; year:2012 ; number:2 ; month:03 ; pages:162-172 ; extent:10

Katalog-ID:	OLC1888112735

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