An All-Digital Jitter Tolerance Measurement Technique for CDR Circuits

Gespeichert in:

Autor*in:	Huang, Y-C [verfasserIn] Wang, P-Y Liu, S-I

Format:	Artikel

Erschienen:	2012

Umfang:	5

Übergeordnetes Werk:	Enthalten in: IEEE transactions on circuits and systems / 2 - New York, NY : Institute of Electrical and Electronics Engineers, 1992, 59(2012), 3, Seite 148-153
Übergeordnetes Werk:	volume:59 ; year:2012 ; number:3 ; pages:148-153 ; extent:5

Katalog-ID:	OLC1891921363

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