Soft Error Triggering Criterion Based on Simplified Electrical Model of the SRAM Cell

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Autor*in:	Wrobel, F [verfasserIn] Touboul, A D Dilillo, L Saigné, F

Format:	Artikel

Erschienen:	2013

Umfang:	5

Übergeordnetes Werk:	Enthalten in: IEEE transactions on nuclear science - New York, NY : IEEE, 1963, 60(2013), 4, 1, Seite 2537-2541
Übergeordnetes Werk:	volume:60 ; year:2013 ; number:4 ; supplement:1 ; pages:2537-2541 ; extent:5

Katalog-ID:	OLC1927141788

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